FJP13007TU

NPN Silicon Transistor


Qualification Data

 Test Standards:

  • Moisture Sensitivity: NA
  • Physical Dimensions: TO-220
  • ESD CDM: 2000


AttributeValueUOM
General Information
Device Marking(TOP MARK)$Y
&3&K
J13007
 
Family Code0S3 
Package TypeTO-220 
Package Description3 LD PLASTIC W/EXPOSED HEATSNK 
Pin Count3 
FIT11.5 
Restriction of Hazardous Substance
Standard Plating FinishMatte Sn 
Die Fabrication
Fabrication Process IdentifierDD5051D 
Package Assembly*
Plating Finish Layer Thickness8.0um - 13um 
Moisture SensitivityNA 
Electrical Test
ESD Charged Device Model (CDM)2000V
Package Assembly*
Wire MaterialAL 
Wire Diameter8.0 MIL 

*If an attribute is listed twice, either can be used on the part.

Multilanguage - Chinese Multilanguage - English Multilanguage - Japanese Multilanguage - Korean
spacespace