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FJPF5200OTU
NPN Epitaxial Silicon Transistor

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Qualification Data

Fairchild Product Reliability Report

    Test Standards:

  • Moisture Sensitivity: NA
  • Physical Dimensions: TO-220F
  • ESD HBM: 8000
  • ESD CDM: 2000

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AttributeValueUOM
General Information
Device Marking(TOP MARK)$Y&Z&E&3
J5200
O
 
Family Code0S3 
Package TypeTO-220F 
Package Description003, PLASTIC MOLDED TO220-3 LDS, ISOLATED HEAT SINK 
Pin Count3 
FIT11.5 
Die Fabrication
Fabrication Process IdentifierDE4315X 
Package Assembly*
Moisture SensitivityNA 
Electrical Test
ESD Human Body Model (HBM)8000V
ESD Charged Device Model (CDM)2000V
Package Assembly*
DAP Size283*244 MILS 
Frame MaterialDUAI GAGE SINGLE STAND 
Wire MaterialAL 
Wire Diameter12.0 MIL 

*If an attribute is listed twice, either can be used on the part.

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