MJD31CITU

NPN Epitaxial Silicon Transistor

Test Standards:

Attribute	Value
General Information
Device Marking(TOP MARK)	$Y&Z&3&K MJD 31C-I
Family Code	0S3
Package Type	TO-251(IPAK)
Package Description	ADDED FOR DPP(INTERSIL) PKG ID CHANGE
Pin Count	3
FIT	11.5
Restriction of Hazardous Substance
Standard Plating Finish	Matte Sn
Die Fabrication
Fabrication Process Identifier	DD0029E
Package Assembly*
Plating Finish Layer Thickness	8.0um - 13um
Moisture Sensitivity	NA
Frame Material	AG (159*128) PDD
UL Flammability Rating	UL94-V0
Wire Material	AU
Wire Diameter	2.0 MIL

*If an attribute is listed twice, either can be used on the part.