MJD44H11TM
NPN Epitaxial Silicon Transistor
Test Standards: - Moisture Sensitivity: 1
- Physical Dimensions: TO-252(DPAK)
| General Information | | Device Marking(TOP MARK) | $Y&Z&3&K
MJD
44H11
| | Family Code | 0SE | | Package Type | TO-252(DPAK) | | Package Description | ADDED FOR DPP(INTERSIL) PKG ID CHANGE | | Pin Count | 3 | | FIT | 72.2 | |
| Restriction of Hazardous Substance | | Standard Plating Finish | Matte Sn | | Die Fabrication | | Fabrication Process Identifier | DD5045B | | Package Assembly* | | Plating Finish Layer Thickness | 8.0um - 13um | | Moisture Sensitivity | 1 | | Wire Material | AL | | Wire Diameter | 6.0 MIL | | DAP Size | 159*128MILS | | Frame Material | NI | |
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| UL Flammability Rating | UL94-V0 |
*If an attribute is listed twice, either can be used on the part.
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