Fairchild Semiconductor
74LCX07BQX
Low Voltage Hex Buffer with Open Drain Outputs

Qualification Data

Fairchild Product Reliability Report

    Test Standards:

  • Moisture Sensitivity: 1
  • Physical Dimensions: DQFN
  • ESD HBM: 4000
  • ESD CDM: 3000
  • ESD MM: 250
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AttributeValueUOM
General Information
Device Marking(TOP MARK)$Y&Z&2&K
LCX07
 
Family Code07K 
Package TypeDQFN 
Package Description14LD,DQFN,JEDEC MO-241,2.5X3.0 MM 
Pin Count14 
FIT1.4 
MSL Rating| 
Restriction of Hazardous Substance
Standard Plating FinishSn 
Die Fabrication
Fabrication Process Identifier7K6LVC80C 
Package Assembly*
Plating Finish Layer Thickness8.0um - 13um 
Moisture Sensitivity1 
Electrical Test
ESD Human Body Model (HBM)4000V
ESD Charged Device Model (CDM)3000V
ESD Machine Model (MM)250V
Package Assembly*
DAP Size3X2.5 MM 
Die Attach TypeEpoxy / EN-4620K 
Wire MaterialAu 
Wire Diameter1.0 MIL 

*If an attribute is listed twice, either can be used on the part.

© Copyright 2009 Fairchild Semiconductor