Fairchild Semiconductor
74VHC00MTCX
Quad 2-Input NAND Gate

Qualification Data

Fairchild Product Reliability Report

    Test Standards:

  • Moisture Sensitivity: 1
  • Physical Dimensions: TSSOP
  • ESD HBM: 2000
  • ESD CDM: 2000
  • ESD MM: 300
space



AttributeValueUOM
General Information
Device Marking(TOP MARK)$Y&Z&2&K
V00
 
Family Code08P 
Package TypeTSSOP 
Package Description014,PLASTIC, TSSOP 4.4MM W,.65MM PH,JEDEC 
Pin Count14 
FIT1.9 
Maximum Reflow Temperature260C 
MSL Rating1| 
Restriction of Hazardous Substance
Standard Plating FinishNiPdAu (Penang); Matte Sn (Carsem, ATP) 
Base Metal/Leadframe MaterialCopper,Nickel,Silicon,Magnesium,Silver 
Lead Pitch650 
Minimum Lead Spacing350 
Die Fabrication
Fabrication Process Identifier8P680CP 
Package Assembly*
Plating Finish Layer Thickness0.5 - 2.0um Ni , 0.0025 - .15um Pd, >0.0025um Au; 8.0um - 13um Matte Sn 
Moisture Sensitivity1 
Electrical Test
ESD Human Body Model (HBM)2000V
ESD Charged Device Model (CDM)2000V
ESD Machine Model (MM)300V
Package Assembly*
UL Flammability RatingUL-94V0 
DAP Size1.5X1.5MM 
Frame MaterialCu 
Die Attach TypeEpoxy / QMI 519 
Wire MaterialAu 
Wire Diameter0.8 MIL 

*If an attribute is listed twice, either can be used on the part.

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