Fairchild Semiconductor
FQI13N50CTU
500V N-Channel Advance Q-FET C-Series

Qualification Data

Fairchild Product Reliability Report

    Test Standards:

  • Moisture Sensitivity: NA
  • Physical Dimensions: TO-262(I2PAK)
space



AttributeValue
General Information
Device Marking(TOP MARK)$Y&Z&E&3
FQI
13N50C
Family Code0SQ
Package TypeTO-262(I2PAK)
Package DescriptionADDED FOR DPP(INTERSIL) PKG ID CHANGE
Pin Count3
FIT12.9
Die Fabrication
Fabrication Process IdentifierEC1350X
Package Assembly*
Moisture SensitivityNA
DAP SizeJEOEC
Frame Material324*225MILS
UL Flammability RatingDPG
Wire MaterialAL
Wire Diameter12.0 MIL
Wire MaterialAL
Wire Diameter6.0 MIL

*If an attribute is listed twice, either can be used on the part.

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