Fairchild Semiconductor
FQU10N20CTU
200V N-Channel Advance Q-FET C-Series

Qualification Data

Fairchild Product Reliability Report

    Test Standards:

  • Moisture Sensitivity: NA
  • Thermal Impedance: 999/999
  • Physical Dimensions: TO-251(IPAK)
space



AttributeValueUOM
General Information
Device Marking(TOP MARK)$Y&Z&E&3
FQU
10N20C
 
Family Code0SQ 
Package TypeTO-251(IPAK) 
Package Description3LD PLAS EXPOSED HEAT SINK,LEAD 9.30 
Pin Count3 
FIT12.9 
MSL Rating| 
Restriction of Hazardous Substance
Standard Plating FinishMatte Sn 
Die Fabrication
Fabrication Process IdentifierSEE SPEC REV 
Package Assembly*
Plating Finish Layer Thickness8.0um - 13um 
Thermal Impedance (Theta JA)999°C/Watt
Thermal Impedance (Theta JC)999°C/Watt
Moisture SensitivityNA 
Wire MaterialAL 
Wire Diameter10.0 MIL 
Wire MaterialAL 
Wire Diameter6.0 MIL 
UL Flammability RatingUL94-V0 
DAP Size159*128MILS 
Frame MaterialNI 

*If an attribute is listed twice, either can be used on the part.

© Copyright 2009 Fairchild Semiconductor