EXAMPLE 1. THERMAL TEST CIRCUIT 
*============================== 
Vdd           5    0    DC  12
Rd            5    4    0.15
Vgs           1    0    PULSE (0  10V  100ns  10ns  10ns  10s  20s)                         
Rg            1    2    50

V_Id          4    3    DC    0
X1            3    2    0     NDP7061l

E_Pin         50   40   value = {V(3,0)*I(V_Id)*(0.008*V(100)+0.8)}                        

X2            50   40    100  7061lTHM   

E_Casetemp    40   0    6     0     1
G_Pin         6    10   40    50    1
R_thermal     6    10   0.001         ; 0.001C/W defaults ideal heatsink Rth
C_thermal     6    10   1000          ; 1000J/C defaults ideal heatsink Cth
V_ambient     10   0    25            ; 25 is ambient temperature
                                        
.LIB          c:\spicedis\dmos\ndp7061l.cir

.PROBE        V(X2.90,40)             ; Normalized single pulsed rjc(t) for TO-220/TO-263 (Normalized single pulsed rja(t) for other package devices)
+             V(100)                  ; Tj
+             V(100,40)               ; Tjc
+             V(6)                    ; Tc 
+             V(6,10)                 ; Tca
+             V(10)                   ; Ta
+             V(50,40)                ; Power input		   
+	      V(2,0)  V(3,0)  I(V_Id) ; Vgs, Vds, & Id        

.OPTION       ITL5=0
.OPTION       RELTOL=0.05
.TRAN/OP      10.0us   100.0s   0    0   uic
.END

*** Apr 1996 Fairchild Semiconductor Discrete POWER & Signal Technology ***