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2007 Product Change Notification (PCN)

PCN# PCN Date Description of Change Notification
Q4074814 12/20/2007
(From): StatsChipPac Kuala Lumpur, Malaysia (To): Fairchild Semiconductor Penang, Malaysia
Q4074814.pdf
Q4074809 12/19/2007
(From): StatsChipPac Kuala Lumpur, Malaysia (To): Fairchild Semiconductor Penang, Malaysia
Q4074809.pdf
Q4074804 12/19/2007
(From): Fairchild Semiconductor 8-inch wafer fabrication line located in Mountaintop, Pennsylvania. e (To): Fairchild Semiconductor QS 9000 approved 6-inch facility for wafer fabrication located in Bucheon, Korea.
Q4074804.pdf
Q4074805 12/17/2007
(From): Selected Mosfet products currently manufactured using the 8-inch line in Mountain Top, PA. The backmetal for the affected products is being changed from 5KA, 3KA, 3.5KA, 20KA (AL-Ti-Ni-Ag). (To): Selected Mosfet devices currently fabricated at Fairchild Semiconductor 8-inch line in Mountain Top, PA, USA will be also manufactured at Advanced Semiconductor Manufacturing Corporation (ASMC), the 6-inch facility for wafer fabrication located in Shanghai, China. The backmetal of these selected devices is being changed to 3KA, 2KA, 10KA (Ti-Ni-Ag). The new backmatal, Ti-Ni-Ag, is a standard backmetal system used on other qualified MOSFET products. There will be no additional change to the die layout, die size, geometry, substrate, device specification, performance and function of any affected devices. Quality and reliability will remain at highest standard.
Q4074805.pdf
Q1070802-A 12/13/2007
(From): Currently being manufactured at SPS(SP Semiconductor & Communication Co Ltd.) in Korea (To): Qualify in Fairchild Semiconductor (Suzhou) Co., Ltd. China as an Alternate Assembly and Test for TO220F 5 leads. (There is no difference in package out line, process and bill of materials
Q1070802-A.pdf
Q4074605 12/12/2007
(From): SOIC-08 package assemble in FSC approved manufacturing locations - Fairchild Malaysia, Amkor, Carsem, Utac Thai Limited (UTL), Unisem, GEM and PSTS using non-green mold compound as shown in table 1. (To): SOIC-08 package assemble in FSC approved manufacturing locations - Fairchild Malaysia, Amkor, Carsem, Utac Thai Limited (UTL), Unisem, GEM and PSTS using green mold compound as shown in table 2.
Q4074605.pdf
Q4074815 12/12/2007
(From): SOT23 and SC70 package assembly at all FSC approved manufacturing locations (FSCP, CARSEM, HANA, UTL, AUK in Dalian, China, JCET, FSPM) using non Green mold compound as shown in table 1: (To): SOT23 and SC70 package assembly at all FSC approved manufacturing locations (FSCP, CARSEM, HANA, UTL, AUK in Dalian, China, JCET, FSPM) using Green mold compound as shown in table 2:
Q4074815.pdf
Q2072402-A 12/7/2007
(From): SPS , SP Semiconductor & Communication Co Ltd. (To): FSSZ , Fairchild Semiconductor (Suzhou) Co., Ltd
Q2072402-A.pdf
Q4074107-A 12/7/2007
(From): passivation layer without Polyimide coating. (To): Polyimide coating will be added on the passivation layer
Q4074107-A.pdf
Q4074811 12/7/2007
(From): SSOT-3 and SSOT-6 package assembly in FSC approved manufacturing locations using non-Green mold compound as shown in table 1: (To): SSOT-3 and SSOT-6 package assembly at all FSC approved manufacturing locations using Green mold compound as shown in table 2:
Q4074811.pdf
Q1070904 12/7/2007
(From): Selected TO252, TO262, and TO263 automotive products currently manufactured in Mountain Top, PA using Fairchild's 8-inch Fab line. These products are presently assembled and tested in Fairchild Semiconductor Cebu, Philippines or STATSChipPAC Kuala Lumpur, Malaysia subcontractor facilities. The current mold compound and plating material of the selected devices will be changed. Please refer to detailed table on page 2 of this PCN. (To): Selected products will now be produced on both 8-inch wafer diameter (located in Mountain Top, PA) as well as 6-inch wafer diameter (located in Bucheon, Korea; Fairchild Semiconductor QS 9000 and TS16949 certified Bucheon, Korea). The plating finish is being changed to Matte Sn. For mold compound changes please refer to detailed table on page 2 of this PCN
Q1070904.pdf
Q4074807 12/5/2007
(From): Current die size: 76x38 (To): New die size: 83x40
Q4074807.pdf
Q4074403 12/04/2007
(From): Fairchilds Micropak packages are currently assembled at ASEM and Hana. These packages are currently assembled as follows: Substrate: Bismaleimide Triazine (BT) CCL-HL832 with NiAu plated, Die attach material: Die attach film LE5000 and LE5030, Wire: 0.8mils Au, Compound: HC-100-SG-BM, Lead Finish: NiAu plated, Packages' dimension remains unchanged. Also refer to the tables below for comparisons of this change. (To): Add FSPM (Fairchild Malaysia) as an additional assembly location for Micropak package, 6-, 8-, and 10-leads. The package material details for the FSPM location are as follows: LeadFrame: Copper frame A194 Full hard with NiPdAu pre-plated, Die attach material: Die attach film LE5003, Wire: 0.8mils Au, Compound: CK203P (Premold) and CK203M (Final mold), Lead Finish: Matte Sn. The external package dimensions will remain unchanged. Additionally the parts produced on FSPM assembly line will be identified by an _F113 suffix on Fairchild part number.
Q4074403.pdf
Q4074806 1130/2007
(From): TSSOP package assembly at all FSC approved manufacturing locations using non Green mold compound as shown in table 1. (To): TSSOP package assembly at all FSC approved manufacturing locations using Green mold compound as shown in table 2.
Q4074806.pdf
Q4074701 11/30/2007
(From): 8LD TSSOP package assembly at all FSC approved manufacturing locations using non Green mold compound as shown in table 1. (To): 8LD TSSOP package assembly at all FSC approved manufacturing locations using Green mold compound as shown in table 2.
Q4074701.pdf
Q4074601 11/30/2007
(From): FPG 8L MLP3x3 package assembly at all FSC approved manufacturing location(s) (Carsem) using non Green mold compound as shown in table 1. (To): FPG 8L MLP 3x3 package assembly at all FSC approved manufacturing location(s) (Carsem) using Green mold compound as shown in table 2.
Q4074601.pdf
Q3073802-A 11/29/2007
(From): Current TO-220 heatsink and die attach pad thickness of 1.30mm. (To): New TO-220 heatsink and die attach pad thickness will be 0.51mm. There is no change in heatsink and die attach pad material. Conversion of heatsink thickness will be done on a part by part basis starting WW05 of 2008 to prevent mixing of product with different heat sink dimensions in shipments during the transition period.
Q3073802-A.pdf
Q3073801-A 11/29/2007
(From): Current TO-220 heatsink and die attach pad thickness of 1.30mm. Material composition of wire used for wire bonding process is gold (Au) wire and copper (Cu) wire. (To): New TO-220 heatsink and die attach pad thickness will be 0.51mm. There is no change in heatsink and die attach pad material. Material composition of wire used during wire bonding process will be copper (Cu). Conversion of heatsink thickness will be done on a part by part basis starting WW05 of 2008 to prevent mixing of product with different heat sink dimensions in shipments during the transition period.
Q3073801-A.pdf
Q3073508-A 11/29/2007
(From): FAN5xxxUC WL-CSP products are assembled and tested at the AMKOR facility (A5) in North Carolina, USA. (To): FAN5xxxUC WL-CSP products will be assembled at the AMKOR facility (K4) in Korea and tested at the AMKOR facility (T3) in Taiwan.
Q3073508-A.pdf
Q4074106-A 11/29/2007
(From): Switch products currently manufactured using Fairchild's 6-inch, class 1, fab process in South Portland, ME. (To): Switch product will now be produced on both 6 inch and 8-inch wafer Diameters. Manufacturing will occur in the same 6-inch Class-1 fab currently producing these products. In some cases, new 8 inch equipment will be added to accommodate the 6 to 8 inch processing conversion. Die size, design, geometry, or layout of the affected products remains un-changed. 8-inch products will be fully compliant to all published data sheet specifications and will be completely interchangeable with current 6-inch product. Quality and reliability will remain at the highest standards already demonstrated with Fairchild's existing products.
Q4074106-A.pdf
Q3073505-A 11/29/2007
(From): TO220F 2 and 3 Leads are currently being manufactured at SPS (SP Semi)/ENOCH located in Korea. (To): Qualify Fairchild Semiconductor located in Suzhou, China as an Alternate Assembly and Test manufacturing site for TO220F 2 and 3 leads. There is no difference in the Package Outline, Bill of materials and Process between the current and the Alternate manufacturing site.
Q3073505-A.pdf
Q3073401-A 11/19/2007
(From): DAP size from 1.4mm x 1.4mm non-matrix Also detector die size from 24mil x 24mil. (To): DAP size to 2mm x 2.3mm matrix. Also, detector die size to 17mil x 25mil.
Q3073401-A.pdf
Q4070136 11/16/2007
All standard Fairchild Semiconductor products shipped after March 1, 2006 have met the RoHS directive for Lead free lead finish; therefore it is not necessary to continue to offer product both with and without the “_NL” No-Lead indicator. Product ordered with or without the “_NL” indicator is identical; there is no difference in manufacturing process, materials, or device marking.
Q4070136.pdf
Q4074501 11/15/2007
(From): Selected planar UltraFET products are currently manufactured using below fab locations: 1) Fairchild's 8" fab process in Mountain Top, PA, USA. 2) Advanced Semiconductor Manufacturing Corp (ASMC) 6" fab process in Shanghai, China. 3) Central Semiconductor Manufacturing Corp (CSMC) 6" fab process in Wuxi, China. (To): Products will also be qualified using Central Semiconductor Manufacturing Corp (CSMC) 6" fab process located in Beijing, China. There will be no change to the layout, die size, geometry, substrate, device specifications, performance and function of any affected devices. Quality and reliability will remain at the highest standard. The process and materials used are identical to the original manufacturing sites.
Q4074501.pdf
Q4074404 11/15/2007
(From): Selected FS35C 2LM (0.35 micron 2 layer metal) logic products currently manufactured using Fairchild's 6-inch Class 1 fab process in South Portland, ME. (To): Products will now be produced on both 6-inch and 8-inch wafer diameters. Manufacturing will occur in the same 6-inch Class 1 fab currently producing these products. New 8-inch equipment has been added to accommodate metal and dielectric layer planarization from SOG (Spin-on-glassivation) to CMP (Chemical-mechanical polish). Die size, design, geometry, or layout of the affected products remains unchanged. This change will not impact the parametric performance or electrical characteristics of any affected device. 8-inch product will be fully compliant to all published datasheet specifications and will be completely interchangeable with current 6-inch product. Quality and reliability will remain at the highest standards already demonstrated with Fairchild's existing products.
Q4074404.pdf
Q4074001 11/13/2007
(From): FPG MLP 3X3 and SPG MLP 2.5X3.5 Assembly at Fairchild Semiconductor Malaysia Sdn. Bhd. (To): Carsem Malaysia Sdn. Bhd. is being added as an additional manufacturing site for FPG MLP 3X3 and SPG MLP 2.5X3.5 upon successful completion of Fairchild's qualification process. Fairchild Semiconductor Malaysia Sdn. Bhd. will continue to produce FPG MLP 3X3 and SPG MLP 2.5X3.5 package types.
Q4074001.pdf
Q4074402 11/09/2007
Alternate Assembly Site Location / Qualification, Package Change (Lead Frame), Plating Material Change.
Q4074402.pdf
Q3073208-A 11/09/2007 (From): Change die attach epoxy, Hitachi EN4620K (To): Die attach epoxy, Henkel QMI-519 Q3073208-A.pdf
Q4074105 11/02/2007
(From): Two type of die dimension: 0.35mm * 0.35mm for 2.0-20V DO35 product; 0.45mm * 0.45mm for 22-75V DO35 product. (To): Consolidate to one die dimension 0.32 mm * 0.32 mm for 2.4V~75V DO35 product. There is no difference in package dimension, process and electrical specification after change.
Q4074105.pdf
Q4074301 11/02/2007
(From): Aimhighglobal_Weihai in China (To): AUK_Dalian in China It's also certified for TS16949 and ISO14001 certificated. Reason for Change : To fully transfer the assembly & test process of TO92 high
Q4074301.pdf
Q4074302 10/31/2007
(From): Pre-Driver PMOS pull-up 14x50 (700um ) x2 (To): Pre-Driver PMOS pull-up 14x50 (700 um) x1 Reason for
Q4074302.pdf
Q4074103 10/30/2007
(From): Current dual lead frame (433086, 436489, 422170, 422162, 427732) (To): New matrix lead frame (426895Q, 436896Q, 436897Q, 436898Q, 436899Q)
Q4074103.pdf
Q4074202 10/30/2007
(From): FANxxxx WL-CSP products are assembled and tested at the Amkor A5 facility in North Carolina, USA. (To): FANxxxx WL-CSP products will be also assembled and tested at the Fairchild facility in Penang, Malaysia.
Q4074202.pdf
Q4074106 10/22/2007
(From): Switch products currently manufactured using Fairchild's 6-inch, class 1, fab process in South Portland, ME. (To): Switch product will now be produced on both 6 inch and 8-inch wafer Diameters. Manufacturing will occur in the same 6-inch Class-1 fab currently producing these products. In some cases, new 8 inch equipment will be added to accommodate the 6 to 8 inch processing conversion. Die size, design, geometry, or layout of the affected products remains un-changed. 8-inch products will be fully compliant to all published data sheet specifications and will be completely interchangeable with current 6-inch product. Quality and reliability will remain at the highest standards already demonstrated with Fairchild's existing products. Reason for Change : Fairchild Semiconductor is adding 8 inch wafer capacity for processing
Q4074106.pdf
Q4074107 10/19/2007
(From): passivation layer without Polyimide coating (To): Polyimide coating will be added on the passivation layer
Q4074107.pdf
Q2071901-B 10/16/2007
(From): FPG MLP 2x2 Assembly at FSC Penang only (To): FPG MLP 2x2 Assembly at FSC Penang & subcon, Carsem
Q2071901-B.pdf
Q3073704 10/12/2007
(From): Copper lead frame (To): Copper leadframe or Iron lead frame (Qualification of Iron(Fe)leadframe as alternate material for TO92 package)
Q3073704.pdf
Q3073705 10/12/2007
(From): Wirebond material using 2mil Gold (Au) wire for SO8 devices manufactured in subcontractor site, GEM Electronics Ltd Shanghai China. (To): Wirebond material using 2mil Copper (Cu) wire for SO8 devices manufactured in subcontractor site, GEM Electronics Ltd Shanghai China.
Q3073705.pdf
Q3073802 10/09/2007
(From): Thicker heatsink and die attach pad. (To): Thinner heatsink and die attach pad (there is no change in heatsink and die attach pad material).
Q3073802.pdf
Q3073801 10/09/2007
(From): Thicker heatsink and die attach pad. Material composition for wire used during wire bonding process is gold wire and copper. (To): Thinner heatsink and die attach pad (there is no change in heatsink and die attach pad material). Material composition for wire used during wire bonding process will be copper.
Q3073801.pdf
Q2071603-B 10/3/2007
(From): AUK in Korea Description of Change (To): Jiangsu Changjiang Electronics Technology (JCET) in China is being qualified as an additional SOT89 package assembly/test site, There is no difference in package dimension, process and electrical specification between the two sites. (Marketing outline drawing refer to MKT-MA03C).
Q2071603-B.pdf
Q3073404 9/27/2007
(From): Current dual leadframe (433086, 436489, 422170, 422162, 427732) Description of Change (To): New matrix leadframe (436895Q, 436896Q, 436897Q, 436898Q, 436899Q)
Q3073404.pdf
Q3073302 9/27/2007
(From): Bonding wire material is Gold (Au) Description of Change (To): Bonding wire material is Copper (Cu).
Q3073302.pdf
Q3073602 9/21/2007
(From): Current Marking / Flowcode Description of Change (To): Aligned Marking / Flowcode
Q3073602.pdf
Q3073510 9/21/2007
(From): FDSS2407, FDSS2407_SB82086, FDSS2407_SB82097 devices manufactured with No Passivation. Description of Change (To): FDSS2407, FDSS2407_SB82086, FDSS2407_SB82097 devices manufactured with Nitride Passivation.
Q3073510.pdf
Q1071304-A 9/13/2007
(From) STS in Korea Description of Change (To): PSTS in China. It's also certified for ISO9001, QS-9000 and ISO14001 certificated.
Q1071304-A.pdf
Q3073401 9/13/2007
(From): Strip leadframe Description of Change (To): Matrix leadframe (no change to leadframe dimensions)
Q3073401.pdf
Q3073508 9/11/2007
(From): FAN5xxxUC WL-CSP products are assembled and tested at the AMKOR facility (A5) in North Carolina, USA (To): FAN5xxxUC WL-CSP products will be assembled at the AMKOR facility (K4) in Korea and tested at the AMKOR facility (T3) in Taiwan.
Q3073508.pdf
Q3073506 9/11/2007
(From): 8um/40V fab process in Bucheon, Korea. (To): 1.5um/40V fab process in Bucheon, Korea. Functionality and electrical characterics remain within current datasheet specifications.
Q3073506.pdf
Q3073305 9/7/2007
(From): Current wafer and die sales Assembly Site: STATSChipPAC MALAYSIA SDN BHD (SCM) at 73, Lorong Enggang ulu Kelang FTZ, 54200 Kuala Lumpur, Malaysia. (To): New wafer and die sales Assembly Site: FAIRCHILD SEMICONDUCTOR (PHILIPPINES), INC. (FSCP) at MEPZ, Lapu-lapu City, Cebu Philippines 6015.
Q3073305.pdf
Q3073505 9/7/2007
(From): SPS/Enoch (To): Fairchild Suzhou China
Q3073505.pdf
Q3073502 9/7/2007
(From): SPS/Enoch (To): Fairchild Suzhou China
Q3073502.pdf
Q3073504 9/7/2007
(From): AHG (To): Fairchild Suzhou China
Q3073504.pdf
Q3073503 9/7/2007
(From): SPS (To): Fairchild Suzhou China
Q3073503.pdf
Q3073402 9/6/2007
(From): 8-mil Aluminum wire bonding material on Source pad/lead connection.(To): 40 mils x 6 mils Aluminum ribbon bonding material on Source pad/lead connection.
Q3073402.pdf
Q3073113 9/5/2007
(From): TO126 currently assembled/tested at Aimhigh Global_ Weihai and Shantou Huashan Electronic, both in China. (To): Aimhigh Global_Weihai will be removed from AVL and replaced by AUK_Dalian in China as an alternative site for TO126 assembly/test with no changes to BOM and package dimensions. Shantou Huashan Electronic in China will remain as an assembly/test site for the TO126. Both listed suppliers are ISO9001, ISO4001 and TS-16949 certified.
Q3073113.pdf
Q3073208 9/4/2007
Description of Change (From): Change die attach epoxy, Hitachi EN4620K Description of Change (To): Die attach epoxy, Henkel QMI-519
Q3073208.pdf
Q3073202 9/4/2007
(From): StatsChipPAC (Kuala Lumpur, Malaysia) (To): Fairchild Semiconductor (Suzhou, China)
Q3073202.pdf
Q3073204 8/31/2007
(From): StatsChipPAC (Kuala Lumpur, Malaysia) (To): Fairchild Semiconductor (Suzhou, China) Note 1: For products FGD3N60LSDTM, RHRD660S9A_S2515, RURD620CCS9A_SB82068, RURD4120S9A_SB82080, RURD660S_R4812, RURD620CCS9A_R4870,FGD3N60LSDTM_SB82092, the rectifier die diameter will change from 4" to 5"; Note 2: The molding compound for products HGTD1N120BNS9A will be EME6600CS; The molding compound for products FGD3N60LSDTM, RURD620CCS9A_R4870, RURD660S_R4812,FGD3N60LSDTM_SB82092 will be KTMC5900; The molding compound for products RHRD660S9A_S2515, RURD620CCS9A_SB82068,RURD4120S9A_SB82080 will be AMC2RC.
Q3073204.pdf
Q3073304 8/30/30
(From): Veh : 2.13/2.4/2.57(V) (To): Veh :2/2.4/2.8(V)
Q3073304.pdf
Q3073212 8/28/2007
(From): Current UBM: Sputtering UBM - Ti-Cu; Solder Bumping at Amkor Technology, Inc, A5-Unitive, 140 Southcenter Ct, Suite 600Morrisville, NC 27560. (To): Alt UBM: Salt Lake, UT will add polyimide and metal layers;PacTech will add ENiAu; Solder Bumping will be done at FSC, Cebu, Philippines.
Q3073212.pdf
Q3073213 8/24/2007
(From): StatsChipPAC (Kuala Lumpur, Malaysia) (To): Fairchild Semiconductor (Suzhou, China)
Q3073213.pdf
Q1070803-A 8/24/2007
(From): Current Assembly site: STATSChipPAC, Shanghai Description of Change (To): Alternate Assembly site: Fairchild, Malaysia
Q1070803-A.pdf
Q3073203 8/22/2007

 (From): StatsChipPAC (Kuala Lumpur, Malaysia) To): Fairchild Semiconductor (Suzhou, China) Note 1: For products HGTP12N60A4D_NW82098 and RHRP860_R4647 the Rectifier die Diameter will change from 4" to 5"; Note 2: The molding compound for products HGTP12N60A4D_NW82098 and RHRP860_R4647 will be EME6600CS. The molding compound for all other products will be SI7200DX2.

Q3073203.pdf
Q3073214 8/22/2007

(From): StatsChipPAC (Kuala Lumpur, Malaysia) (To): Fairchild Semiconductor (Suzhou, China) Note 1: For products HGT1S7N60A4DS9A_R4921 and FFB20UP20DN_SB82117 the rectifier die diameter will change from 4" to 5"; Note 2: The molding compound for products HGT1S7N60A4DS9A_R4921 and FFB20UP20DN_SB82117 will be KTMC5900, the molding compound for all other products will be EME6600CS.

Q3073214.pdf
Q1070501-C 8/22/2007

(From): Wire bond material currently used for our MLP 5x6 discrete products assembled from Fairchild (M), FSPM facility will be changed from Au wire to Cu wire. Package with this change will have an identifier. There will be no change in terms of wire diamter and type of thermosonic bonding process applied. (To): From Au wire used in MLP 5x6 Discrete products to Cu wire

Q1070501-C.pdf
Q3073114 8/22/2007

 (From): StatsChipPAC (Kuala Lumpur, Malaysia) (To): Fairchild Semiconductor (Suzhou, China)

Q3073114.pdf
Q3073115 8/22/2007

 (From): StatsChipPAC (Kuala Lumpur, Malaysia)  (To): Fairchild Semiconductor (Suzhou, China), (Note: The molding compound for products ISL9V3036D3S and FDD068AN03L will be EME6600CS, The molding compound for all other products will be AMC2RC)

Q3073115.pdf
Q2071703-A 8/14/2007

(From): LMV324 and LMV358 in SOIC is currently Assembled and Tested at subcon Carsem, Ipoh/Malaysia (To): To qualify LMV324 and LMV358 SOIC Assembly and Test at
Fairchild's Facility in Penang, Malaysia.

Q2071703-A.pdf
Q3072902 8/13/2007

 (From): *Shipping box dimension: : 395*385*275mm  (To): *Shipping box Dimension: : 390*370*310mm.

Q3072902.pdf
Q1071101-A 8/13/2007

 (From): The original location of JCET SOT223 assembly line: No 275, Binjiang Rd. M, Jiangyin, Jiangsu, P.R.C (To): The new location of JCET SOT223 assembly line: No 78
Changshan Rd. Jiangyin, Jiangsu, P.R.C. There is no difference in package dimension, process
and material between these sites

Q1071101-A.pdf
Q3072802 8/10/2007

(From): Current manufacturing location at Fairchild Semiconductor Malaysia Sdn. Bhd.
 (To): Unisem Malaysia Sdn. Bhd. is being added as an additional manufacturing site for SOIC-8L package type upon successful completion of Fairchild's qualification process. Fairchild Semiconductor Malaysia Sdn. Bhd. will continue to produce SOIC-8L package types.

Q3072802.pdf
Q3073201 8/10/2007

From): Paper box packing for GBPC parts (To): Plastic tray + box + shrinkage film to pack the GBPC parts.

Q3073201.pdf
Q3072901 8/9/2007

(From): 1line: F logo 2line:device name & week code 3line:Device name) (To): 1line: F logo, assy plant code, week code 2line:Device name 3line:device name.

 
Q2071901-A 8/6/2007

(From): FPG MLP 2x2 Assembly at FSC Penang only (To): FPG MLP 2x2 Assembly at FSC Penang & subcon, Carsem.

Q2071901-A.pdf
Q2071603-A 8/1/2007

 (From): AUK in Korea (To): Jiangsu Changjiang Electronics Technology (JCET) in China is
being qualified as an additional SOT89 package assembly/test site, There is no difference in
package dimension, process and electrical specification between the two sites. (Marketing
outline drawing refer to MKT-MA03C).

 
Q3072701 8/1/2007

(From): Existing epoxy and dye (Hysol) (To): Fairchild is adding Eclat, Epifine and Richtech as epoxy and dye material suppliers. All of the epoxy and dye materials are qualified to be used interchangeably. There is no difference in the form, fit, function or manufacturability of the devices when either the Hysol material or the alternate materials are used for assembly

Q3072701.pdf
Q3072803 8/1/2007

(From): Barcode lable was attached back of Reel. (To): Barcode lable was attached front of Reel.

Q3072803.pdf
Q3072801 7/30/2007

(From): Use of special flowcode for Cu devices. (To): Remove flowcode used for Cu devices and convert the standard part to Cu wire.

Q3072801.pdf
Q3073001 7/30/2007

(From): From Latch Circuit in Soft Start Block (To): To Nand Logic in the soft start block and there is no electrical specification change.

Q3073001.pdf
Q1070805 7/19/2007

(From): Wirebond material using 2mil Gold (Au) wire for SO8 devices manufactured in subcontractor site, GEM Electronics Ltd Shanghai China. (To): Wirebond material using 2mil Copper (Cu) wire for SO8 devices manufactured in subcontractor site, GEM Electronics Ltd Shanghai China.

Q1070805.pdf
Q2072608 7/13/2007

(From): TSC(TianJing) (To): TSC(YangXin) is being added as an alternative assembly/test
location. There is no difference in package dimension, process and material between the two
sites.

Q2072608.pdf
Q2072402 6/29/2007

 (From): AHG (To): Fairchild Suzhou in China is being added as an alternative
assembly/test location

Q2072402.pdf
Q1070804 06/26/2007

(From): Current assembly and test site: ChipPAC, Malaysia (To): Alternate assembly and test site: Suzhou, China. This facility is located at 1 Sutong Road, China-Singapore Suzhou Industrial Park Suzhou, Jiangsu P. R. of China.

Q1070804.pdf
Q2072501 6/26/2007

(From): AUK in Korea AHG in China (To): AUK Dalian in China will be qualified as an alternatate assembly site for TO92 package. In addition to current suppliers,It is also TS16949 and ISO14001certified.

Q2072501.pdf
Q2072502 6/26/2007

(From): FANxxxx WL-CSP products are assembled and tested at the Amkor facility in North Carolina, USA. (To): FANxxxx WL-CSP products will be also assembled and tested at
the Fairchild facility in Penang, Malaysia.

Q2072502.pdf
Q2071909 6/26/2007

 (From): There are some items which will be corrected from gFS: 15S(Typ)// td(on): 7.2ns(Typ), 25(max)// tr: 68ns(typ), 146ns(max)// td(off): 77ns(typ), 164ns(max)// tf: 93ns(typ), 196ns(max)// trr: 62ns(typ)// Qrr: 150nC(typ) (To): to gFS: 32S(Typ)// td(on): 39ns(Typ), 88(max)// tr: 181ns(typ), 372ns(max)// td(off): 183ns(typ), 376ns(max)// tf: 82ns(typ), 173ns(max)// trr: 80ns(typ)// Qrr:193nC(typ)

Q2071909.pdf
Q2071902 6/26/2007

 (From): Signetics in Korea  (To): PSTS (Phoenix Semiconductor Telecommunication (suzhou) CO., LTD) in China

Q2071902.pdf
Q20072004 6/26/2007

(From): There are no passivation layer. (To): Adding Passivation layer on front metal.

Q20072004.pdf
Q2071907 5/21/2007

 (From): Lite-on Shanghai,China  (To): In addition to Lite-On Shanghai, China; Taiwan Semiconductor Company, Tianjin, China is being added as an alternative assembly/test location.

Q2071907.pdf
Q2072401 6/19/2007

 (From): 1. Shutdown Current decay time ~ 30 sec 2. Power Good logic is high when En goes low 3. Third line marking has "C" (To): 1. Shut down current decay time ~ 1 msec 2. Power Good logic is low when En is low 3. Third line marking has "C1"

Q2072401.pdf
Q1070908-A 5/18/2007

(From): Adding Fairchild Assembly site in Penang, Malaysia as alternate Assembly site for Signetic, Korea (To): Qualify Fairchild Assembly site in Penang, Malaysia to assemble
and test 20 lead SOP and 20 lead SOIC package.

Q1070908-A.pdf
Q2071905 5/18/2007

 (From): Die change. (To): Four changes were made to the current production die with metal
mask updates. Change 1: The receiver serial clock signal was delayed to better center on the
serial data. Change 2: Internal serial interconnects were re-routed for better isolation from
transient signals. Change 3: The serial standby burst source current, IODSTBY, was increased
to improve noise immunity. The serial burst source current was increased from 130uA to 200uA typical. Change 4: ESD robustness was improved by adding a filter to ignore ESD transientevents on the serial lines.

Q2071905.pdf
Q1070501-B 5/16/2007

 (From): Wire bond material currently used for our MLP 5x6 discrete products assembled from Fairchild (M), FSPM facility will be changed from Au wire to Cu wire. Package with this change will have an identifier. There will be no change in terms of wire diameter and type of thermosonic bonding process applied. (To): From Au wire used in MLP 5x6 Discrete products to Cu wire

Q1070501-B.pdf
Q1071305-A 6/14/2007

 (From): ENOCH, SP, STS in Korea, SHEDCL in China.(To): ENOCH, SP in Korea, SHEDCL and PSTS in China.

Q1071305-A.pdf
Q2071901 5/14/2007

(From): FPG MLP 2x2 Assembly at FSC Penang only (To): FPG MLP 2x2 Assembly at FSC Penang & subcon, Carsem

Q2071901.pdf
Q2072203 6/13/2007

 (From): Current Plating Coverage: Full NiPdAu Plating. Current Die attach Material: Tin-Antimony (Sn8.5Sb). (To): Proposed Plating Coverage: Selective NiPdAu plating on the
leadposts and exposed pad areas. The rest of the areas will be bare Copper. Proposed Die attach Material: High-Lead (92.5Pb5Sn2.5Ag).

Q2072203.pdf
Q1070907-A 6/13/2007

 (From): STATS ChipPAC in Malaysia (To): STATS ChipPAC in Malaysia and Fairchild Suzhou China

Q1070907-A.pdf
Q2071910 6/13/2007

(From): TO-3PN Package :L/F plating change : from Bare Cu L/F + With pre-bake process (To): to Ni plated L/F + Without pre-bake process

Q2071910.pdf
Q2072102 6/12/2007

 (From): Aim High Global in Korea (To): Fairchild Suzhou China

Q2072102.pdf
Q2072201 6/11/2007

(From): aimhigh global corp. in Korea. (To): SP Semiconductor & Communication Co., Ltd. in Korea.

Q2072201.pdf
Q2071701 6/8/2007

(From): Fairchild (Suzhou) in China (To): GEM (Shanghai) in China

Q2071701.pdf
Q2071605 6/6/2007

 (From): Au wire bonding in SPM3/3V package  (To): Copper wire bonding in SPM3/3V package

Q2071605.pdf
Q1070903-A 6/4/2007

 (From): Current die size: 76x38. With no gate runner.  (To): New die size: 83x40. With 1 gate runner.

Q1070903-A.pdf
Q2072101 5/30/2007

(From): Fairchild Semiconductor products, 74AC138, 74AC139, 74ACT138 and 74ACT139 are currently manufactured in South Portland, Maine using a 6-inch
FACT2.0 process.(To): Fairchild Semiconductor will produce these products at wafer Fab CSMC, located in WuXi, China (PRC). The products listed in the FSID list at the bottom of this document will be manufactured on 6 inch wafers using a CS80C process. All current product package materials, dimensions, markings and datasheet specifications will remain unchanged.

Q2072101.pdf
Q1071307 5/11/2007

(From): TiNiAg Backmetal and eutectic die attach process (To): TiNiAg backmetal and skip cure adhesive die attach process

Q1071307.pdf
Q2071704 5/11/2007

 (From): Fairchild (Suzhou) in China  (To): GEM (Shanghai) in China

Q2071704.pdf
Q1070902-A 5/9/2007

(From): Mold compound Sumitomo G770; Bond wire HP(99.99); Solder ball composition SAC405; Solder mask material AUS05 (To): Mold compound Nitto GE-100-LFC-S; Bond wire HTS(99.0); Solder ball composition SAC105; Solder mask material AUS308 Pg. 1

Q1070902-A.pdf
Q2071703 5/9/2007

(From): LMV324 and LMV358 is currently Assembled and Tested at Carsem (To): To qualify Assembly and Test at Penang

Q2071703.pdf
Q1070601-A 5/8/2007

(From): 8-pin DIP coplanar construction (225C max reflow solder rating) (To): 8-pin DIP over-under construction (260C max reflow solder rating).

Q1070601-A.pdf
Q1071104 5/8/2007

 (From): Current assembly location: ChipPAC, Malaysia  (To): Alternate assembly location: Suzhou, China

Q1071104.pdf
Q2071702 5/7/2007

 (From): Die change To): Four changes were made to the current production die with metal mask updates. Change 1: The receiver serial clock signal was delayed to better center on the
serial data. Change 2: Internal serial interconnects were re-routed for better isolation from
transient signals. Change 3: The serial standby burst source current, IODSTBY,was increased to improve noise immunity. The serial burst source current was increased from 130uA to 200uA typical. The master burst standby current, IBRST_M,was increased from 1.1mA to 1.3mA typical. Change 4: ESD robustness was improved by adding a filter to ignore ESD transient events on the serial lines.

Q2071702.pdf
Q2071501 4/30/2007

(From): Change in carrier tape dimension from Ao = 1.67 +/- 0.05 mm, Bo = 1.17 +/- 0.05
(To): Change in carrier tape dimension to Ao = 1.63 +/- 0.05 mm, Bo =1.12 +/- 0.05 mm

Q2071501.pdf
Q1071005-A 4/27/2007

 (From): 1. Die attach method: Two chip die attach 2. Wire size & QTY:20mil *2ea per chip 3. Ass'y site for TO-220: SP, FSSZ Jedec, SHEDCL (To): 1. Die attach method: Dual chip die attach 2. Wire size & QTY:15mil *1ea per chip 3. Ass'y site for TO-220: SP, FSSZ Jedec, SHEDCL, FSSZ none Jedec, Enoch.

Q1071005-A.pdf
Q2071401 4/26/2007

(From): Mold Compound Sumitomo G770 (To): Mold Compound Nitto GE-100-LFC-S

Q2071401.pdf
Q2071601 4/26/2007

 (From): PanJIT Electronics International Inc. (To): Taiwan Semiconductor Co., Ltd.

Q2071601.pdf
Q3063801 4/19/2007

 (From): SOT-89 Lead frame pad with hole. (To): SOT-89 Lead frame pad without hole.

Q3063801.pdf
Q2071503 4/19/2007

(From): FAB process : 8um/40V  (To): FAB process : 1.5um/40V

Q2071503.pdf
Q1071101 4/18/2007

(From): The original location of JCET SOT223 assembly line: No 275, Binjiang Rd. M, Jiangyin, Jiangsu, P.R.C (To): The proposed new location of JCET SOT223 assembly line: No 78 Changshan Rd. Jiangyin, Jiangsu, P.R.C

Q1071101.pdf
Q1071202 4/18/2007

(From): 1) Noise sensitivity causing logic errors. 2) Test program measure Ilim pin voltage at fixed Vcc 3) Third line top mark: C (To): 1) Add a noise filter in the logic block to reduce the sensitivity to noise. 2) Test program revised to insure stability of Ilim pin voltage versus Vcc. 3) Third line top mark: C1

Q1071202.pdf
Q1070908 4/5/2007

(From): Adding Fairchild Assembly site in Penang, Malaysia as alternate
Assembly site for Signetic, Korea. (To): Qualify Fairchild Assembly site in Penang, Malaysia to assemble and test 20 lead SOP and 20 lead SOIC package

Q1070908.pdf
Q1071201 4/2/2007

(From): The current 74F161A, 74F163A, 74F191 and 74F269 data sheets specify a minimum FMAX (Maximum Clock Frequency) and/or a typical FMAX value at room and at temperature.(To): The revised data sheets will specifiy only a typical FMAX value at
room temperature.

Q1071201.pdf
Q1070601 3/27/2007

(From): 8-pin DIP coplanar construction  (To): 8-pin DIP over-under construction

Q1070601.pdf
Q1070906 3/26/2007

 (From): Current fab location: Salt Lake, Utah (To): Alternate fab location: Mountain Top, PA

Q1070906.pdf
Q4065002 3/23/2007

(From): See details in Change From table (To): See details in Change To table

Q4065002.pdf
Q1070902 3/20/2007

 (From): To improve the robustness of the package bill of materials resulting in increased resistance to intermettalic degradation, use of a Green mold compound, and improved tolerance to mechanical shock. Overall, the BOM change is being pursued to
improve the reliability of the product. (To): To enhance the robustness of the package bill of materials resulting in increased resistance to intermettalic degradation, use of a Green mold compound, and increased tolerance to mechanical shock. Overall, the BOM change is being pursued to enhance the reliability of the product.

Q1070902.pdf
Q1070907 3/20/2007

(From): STATS ChipPAC in Malaysia (To): STATS ChipPAC in Malaysia and Fairchild Suzhou China

Q1070907.pdf
Q1071005 3/20/2007

QTY:20mil*2ea per chip 3. Ass'y site for TO-220: SP, FSSZ Jedec, SHEDCL Description of Change (To): 1. Die attach method: Dual chip die attach 2. Wire size & QTY:15mil *1ea per chip 3. Ass'y site for TO-220: SP, FSSZ Jedec, SHEDCL, FSSZ none Jedec, Enoch.

Q1071005.pdf
Q1071004 3/20/2007

 (From): Die attach method: Two chip die attach Wire size & QTY : 20mil *2ea per chip Ass'y site for TO-220F: SP. (To): Die attach method: Dual chip die attach Wire size & QTY :
15mil*1ea per chip Ass'y site for TO-220F: SP

Q1071004.pdf
Q1070903 3/16/2007

(From): Current die size: 76x38 With no gate runner (To): New die size: 83x40 With 1 gate runner

Q1070903.pdf
Q1070402 3/09/2007

(From): Current assembly and test site: SCM - ChipPAC, Malaysia. To change from single 15mil wire-bond. (To): Alternate assembly and test site: FSSZ - Suzhou, China. To single
20mil wire-bond.

Q1070402.pdf
Q1071001 3/9/2007

 (From): Typical value of Reverse Recovery Charge is 2.1uC. (Condition: VGS = 0 V, IS = 15 A,dIF / dt = 100 A/?s) (To): Typical value of Reverse Recovery Charge is 0.4uC. (Condition : VGS = 0 V, IS = 15 A,dIF / dt = 100 A/?s)

Q1071001.pdf
Q3064005 3/8/2007

(From): Fairchild will change the cover tape used in packaging BGA
devices to a Pressure Sensitive Adhesive (cold seal).
(To): To a cover tape with Heat Activated Adhesive (heat seal). The
supplier for carrier and cover tapes will also be changed from 3M to SPT but the carrier tape dimensions will remain the same.

Q3064005.pdf
Q1070501 3/5/2007

(From): Wire bond material currently used for our MLP 5x6 discrete
products assembled from Fairchild (M), FSPm facility will be changed from Au wire to Cu
wire. Package with this change will have an identifier. There will be no change in terms of wire
diamter and type of thermosonic bonding process applied.
(To): From Au wire used in MLP 5x6 Discrete products to Cu wire

Q1070501.pdf
Q1070803 3/2/2007

(From): Current Assembly site: STATSChipPAC, Shanghai
 (To): Alternate Assembly site: Fairchild, Malaysia

Q1070803.pdf
Q1070201 2/28/2007

(From): Standard 1.5 x 1.5 BGA lead frame. See drawings attached under "Change To" section.
 (To): 1.5 x 1.5 BGA "Folded leadframe" design. See drawings attached.

Q1070201.pdf
Q1070101 2/13/2007

From): Change in carrier tape pocket hole dimension from 1.0 mm (To): Change in carrier tape pocket hole dimension to 0.8 mm.

Q1070101.pdf
Q1070401 2/1/2007

(From): Eliminate the Caution Label found in the moisuture barrier bag per IPC/JEDEC J-STD-033B (To): An additional label is placed on the bag to indicate the Level 1 classification and maximum reflow temperature information in human readable form. See attached sample:

Q1070401.pdf
Q1070302 1/29/2007

(From): Fairchild Semiconductor products, 74AC245 and 74ACT245 are currently manufactured in South Portland, Maine using a 6-inch FACT2.0 process.(To): Fairchild Semiconductor will produce these products at wafer Fab, CSMC, located in WuXi, China (PRC). The products listed in the FSID list at the bottom of this
document will be manufactured on 6 inch wafers using a CS80C process. All current product
package materials, dimensions, markings and datasheet specifications will remain unchanged.

Q1070302.pdf
Q2062704 1/23/2007

(From): Fairchild Bucheon managed devices are using two types of Lead frame (Groove type, Non Groove type) for devices packaged in D/I-PAK.(To): One type of Lead frame(Non Groove type) will be used.

Q2062704.pdf
Q4064501 1/23/2007

 (From): PanJIT Electronics International Inc. (To): Taiwan Semiconductor Co., Ltd

Q4064501.pdf
20060301-B 1/18/2007

Fairchild Semiconductor is qualifying Nantong-Fujitsu Microelectronics, based in Nantong, Jiangsu Province, China as the out-source assembly and test location for NMDIP package types that are currently assembled and tested in Fairchild Malaysia facility. These NMDIP products will be completely out-source to Nantong upon successful completion of Fairchild's qualification process. Nantong-Fujitsu Microelectronics is ISO9001:2000, QS9000 and ISO14001 certified.

20060301-B.rtf
Q4064901 1/09/2007

Fairchild issued an initial company-wide PCN to all customers of record announcing the transition to Pb-free products on July 11, 2003 (PCN # 20032701). In that notification, the following statement was made, “The manufacture of products with tin-lead plating will be completely discontinued as products with lead-free finish are introduced. After the transition period, Fairchild's standard products will only be available with a lead-free finish”. An additional notification was sent to all customers of record on May 24, 2004 (PCN # 20032701-A) which stated, “As each package type is converted, the manufacture of products with traditional SnPb plating will be completely discontinued. After the transition period, Fairchild’s standard products will only be available with a Pb-free finish”. As stated on the Pb-free section of Fairchild’s website, “Fairchild's goal is to transition all customers to Pb-free products. We do understand that for various reasons, some customers will not be ready to convert to Pb-free processing at this time. Fairchild will help these customers by continuing a supply of SnPb products for as long as manufacturing capability and viable customer demand exists. However, many of our manufacturing facilities and partners no longer have the ability to provide SnPb plating. Several others are likely to eliminate SnPb plating by the end of calendar year 2006. It is likely that our ability to provide SnPb plated products after the beginning of 2007 will be limited”. Since the conversion to Pb-free, Fairchild has continued efforts to support customers with SnPb products whenever possible. However, the overwhelming acceptance of Pb-free products has led to a greatly reduced demand for SnPb devices and it is becoming increasingly difficult to source these parts. At this time Fairchild can no longer commit to a continued supply and must follow through on the previous customer notifications to completely discontinue the support for SnPb products.

Q4064901.pdf
Q4064703 12/18/2006

 (From): LM358 and LM393 use the 8um/40V Bipolar process in FCS,
Korea (To): LM358 and LM393 use the 2um/36V Bipolar process in BCDsemi, China

Q4064703.pdf

Note: for more product change notification customer letters, please visit PCNalert.com (exiting Fairchild)

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