17424 NCH POWER MOSFET STD GATE Reliability Qualification Report - Fairchild Discrete Power

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Power MOSFET Reliability Summary

Part Number Type		Die Type		Package
IRFP340		17424		TO-247
Test 9023 Lot 1
Stress	Conditions	Results	Sample Size	Duration
Drain Bias	Tc=150C, Vds=80% Rated	0	40	1000	Hrs
Gate Bias	Tc=150C, Vgs=100% Rated	1	40	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	40	1000	Cyc
Operating LIfe	Tc=150C, Vds=15V	0	40	1000	Hrs
Relative Humidity	Ta=85C, RH=85%	0	40	1000	Hrs

Part Number Type		Die Type		Package
IRFP340		17424		TO-247
Test 9023 Lot 2
Stress	Conditions	Results	Sample Size	Duration
Drain Bias	Tc=150C, Vds=80% Rated	0	40	1000	Hrs
Gate Bias	Tc=150C, Vgs=100% Rated	0	40	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	40	1000	Cyc
Operating LIfe	Tc=150C, Vds=15V	0	40	1000	Hrs
Relative Humidity	Ta=85C, RH=85%	0	40	1000	Hrs