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Power MOSFET Reliability Summary
| Part Number Type | Die Type | Package | |||
|---|---|---|---|---|---|
| IRF840 | 17425 | TO-220 | |||
| Test KL | |||||
| Stress | Conditions | Results | Sample Size |
Duration | |
| Thermal Fatigue | PD=4.75W, delta Tj=125C | 0 | 140 | 12,000 | Cyc |
| Drain Bias | Tc=150C, Vds=80% Rated | 0 | 140 | 500 | Hrs |
| Gate Bias | Tc=150C, Vgs=100% Rated | 0 | 140 | 500 | Hrs |
| Thermal Shock | -65C, +150C, Liquid | 0 | 140 | 500 | Cyc |
| Operating LIfe | Tc=150C, Vds=15V | 0 | 120 | 500 | Hrs |
| Pressure Cooker | Ta=121C, 15psi | 0 | 140 | 96 | Hrs |
