Power MOSFET Reliability Summary

Part Number Type Die Type Package
IRFP460 17465 TO-247
Test
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=40W, delta Tj=100C 0 60 20,000 Cyc
Drain Bias Tc=150C, Vds=80% Rated 0 120 1000 Hrs
Gate Bias Tc=150C, Vgs=100% Rated 0 120 1000 Hrs
Temp Cycle -65C, +150C, Air 0 120 1000 Cyc
Thermal Shock -65C, +150C, Liquid 0 40 1000 Cyc
Operating LIfe Tc=175C, Vds=15V 0 60 1000 Hrs
Pressure Cooker Ta=121C, 15psi 0 60 96 Hrs
Relative Humidity Ta=85C, RH=85% 0 50 1000 Hrs

 

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