17522 NCH PWR MOSFET Reliability Qualification Report - Fairchild Discrete Power

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Package Qual Reliability Summary

Part Number Type		Die Type		Package
IRF9640		17522		TO-220
Test 9064 Cell 1
Stress	Conditions	Results	Sample Size	Duration
IOL	PD=4.0W, delta Tj=100C	0	40	10000	Cyc
HT Drain Bias	Tc=150C, Vds=80% Rated	0	40	1000	Hrs
HT Gate Bias	Tc=150C, Vgs=100% Rated	0	40	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	40	1000	Cyc
Autoclave	Ta=121C, 15psi	0	40	168	Hrs
H³TRB	Ta=85C, RH=85%, Vds=40V	0	40	1000	Hrs
Operating Life	Tc=150, Vds=15V	0	40

Part Number Type		Die Type		Package
IRF9640		17522		TO-220
Test 9064 Cell 2
Stress	Conditions	Results	Sample Size	Duration
IOL	PD=4.0W, delta Tj=100C	0	40	10000	Cyc
HT Drain Bias	Tc=150C, Vds=80% Rated	0	40	1000	Hrs
HT Gate Bias	Tc=150C, Vgs=100% Rated	0	40	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	40	1000	Cyc
Autoclave	Ta=121C, 15psi	0	40	168	Hrs
H³TRB	Ta=85C, RH=85%, Vds=40V	0	40	1000	Hrs
Operating Life	Tc=150, Vds=15V	0	40