Power MOSFET Reliability Summary

Part Number Type Die Type Package
RFP70N06 49007 TO-220
Test 7014/41 Lot 1
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
Thermal Fatigue PD=4.75W, delta Tj=125C 0 77 12,000 Cyc
Drain Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
Gate Bias Tc=175C, Vgs=100% Rated 0 77 1000 Hrs
Temp Cycle -55C, +150C, Air 0 77 1000 Cyc
Pressure Cooker Ta=121C, 15psi 0 77 96 Hrs
Relative Humidity Ta=85C, RH=85%, Vds=80V 0 77 1000 Hrs
Operating Life Tj=150C, VDS=15V 0 77 1000 Hrs
ESD CDF-AEC-Q101-001 0 10 6000V  

 

Part Number Type Die Type Package
RFP70N06 49007 TO-220
Test 7014/40 Lot 2
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
Thermal Fatigue PD=4.75W, delta Tj=125C 0 77 12,000 Cyc
Drain Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
Gate Bias Tc=175C, Vgs=100% Rated 0 77 1000 Hrs
Temp Cycle -55C, +150C, Air 0 77 1000 Cyc
Pressure Cooker Ta=121C, 15psi 0 77 96 Hrs
Relative Humidity Ta=85C, RH=85%, Vds=80V 0 77 1000 Hrs
Operating Life Tj=150C, VDS=15V 0 77 1000 Hrs
ESD CDF-AEC-Q101-001 0 10 6000V  

 

Part Number Type Die Type Package
RFP70N06 49007P TO-220
Test 6081 Lot 1
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=4.75W, delta Tj=125C 0 40 20,000 Cyc
Drain Bias Tc=175C, Vds=80% Rated 0 40 1000 Hrs
Gate Bias Tc=175C, Vgs=100% Rated 0 40 1000 Hrs
Temp Cycle -65C, +150C, Air 0 40 1000 Cyc
Operating LIfe Tc=175C, Vds=15V 0 40 1000 Hrs
Relative Humidity Ta=85C, RH=85% 1* 40 1000 Hrs
Pressure Cooker Ta=121C, 15psi 0 40 96 Hrs
* Humidity fail is isolated assembly workmanship

 

Part Number Type Die Type Package
RFP70N06 49007P TO-220
Test 6081 Lot 2
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=4.75W, delta Tj=125C 0 40 20,000 Cyc
Drain Bias Tc=175C, Vds=80% Rated 0 40 1000 Hrs
Gate Bias Tc=175C, Vgs=100% Rated 0 40 1000 Hrs
Temp Cycle -65C, +150C, Air 0 40 1000 Cyc
Operating LIfe Tc=175C, Vds=15V 0 40 1000 Hrs
Relative Humidity Ta=85C, RH=85% 0 40 1000 Hrs
Pressure Cooker Ta=121C, 15psi 0 40 96 Hrs

 

Part Number Type Die Type Package
RFP70N06 49007P TO-220
Test 6081 Lot 3
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=4.75W, delta Tj=125C 0 40 5,000 Cyc
Drain Bias Tc=175C, Vds=80% Rated 0 40 1000 Hrs
Gate Bias Tc=175C, Vgs=100% Rated 0 40 1000 Hrs
Temp Cycle -65C, +150C, Air 0 40 1000 Cyc
Operating LIfe Tc=175C, Vds=15V 0 40 1000 Hrs
Relative Humidity Ta=85C, RH=85% 0 40 1000 Hrs
Pressure Cooker Ta=121C, 15psi 0 40 96 Hrs

 

Part Number Type Die Type Package
RF1S70N06 49007 TO-263
Test kl
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue
VP Preconditioned
PD=4.75W, delta Tj=125C 0 80 8,000 Cyc
Drain Bias Tc=150C, Vds=80% Rated 0 80 1000 Hrs
Gate Bias Tc=150C, Vgs=100% Rated 0 80 1000 Hrs
Thermal Shock, Liquid
VP Preconditioned
-65C, +150C, Air 0 80 1000 Cyc
Pressure Cooker Ta=121C, 15psi 0 52 96 Hrs
Relative Humidity Ta=85C, RH=85% 0 80 1000 Hrs
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