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Power MOSFET Reliability Summary
| Part Number Type | Die Type | Package | |||
|---|---|---|---|---|---|
| RLD1N06CLE | 49011 | TO-251 | |||
| Test | |||||
| Stress | Conditions per AEC Q101 |
Results | Sample Size |
Duration | |
| IOL | PD=2W, delta Tj=100C | 0 | 77 | 10000 | Cyc |
| HT Drain Bias | Tc=150C, Vds=80% Rated | 0 | 77 | 1000 | Hrs |
| HT Gate Bias | Tc=150C, Vgs=100% Rated | 0 | 77 | 1000 | Hrs |
| Temp Cycle | -65C, +150C, Air | 0 | 77 | 1000 | Cyc |
| Autoclave | Ta=121C, 15psi | 0 | 52 | 96 | Hrs |
| Relative Humidity | Ta=85C, RH=85% | 0 | 77 | 1000 | Hrs |
| Operating Life | Tc=150C, Vds=15V | 0 | 77 | 500 | Hrs |
| Thermal Shock | -65C, +150C, Liquid | 0 | 77 | 1000 | Cyc |
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