49021 NCH PWR IGBT LOGIC GATE Reliability Qualification Report - Fairchild Discrete Power

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Power IGBT Reliability Summary

Part Number Type		Die Type		Package
HGTP14N36F3VL		49021		TO-220
Test 5067
Stress	Conditions	Results	Sample Size	Duration
Drain Bias	Tc=150C, Vds=80% Rated	0	75	1000	Hrs
Gate Bias	Tc=150C, Vgs=100% Rated	0	75	1000	Hrs
Temp Cycle	-65C, +150C, Air	0	75	500	Cyc
Pressure Cooker	Ta=121C, 15psi	0	75	168	Hrs

Part Number Type		Die Type		Package
HGTP14N36F3VL		49021		TO-220
Test 5131
Stress	Conditions	Results	Sample Size	Duration
Drain Bias	Tc=150C, Vds=80% Rated	0	75	1000	Hrs
Gate Bias	Tc=150C, Vgs=100% Rated	0	75	1000	Hrs
Temp Cycle	-65C, +150C, Air		75	500	Cyc
Pressure Cooker	Ta=121C, 15psi	0	75	168	Hrs

Part Number Type		Die Type		Package
HGTP14N36F3VL		49021		TO-220
Test 5131
Stress	Conditions	Results	Sample Size	Duration
Drain Bias	Tc=150C, Vds=80% Rated	0	75	1000	Hrs
Gate Bias	Tc=150C, Vgs=100% Rated	0	75	1000	Hrs
Temp Cycle	-65C, +150C, Air	0	75	500	Cyc
Pressure Cooker	Ta=121C, 15psi	0	75	168	Hrs