Power IGBT Reliability Summary

Part Number Type Die Type Package
HGTP14N40F3VL 49023 TO-220
Test 3140 Lot 1
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=4.75W, delta Tj=125C 0 30 10,000 Cyc
Drain Bias Tc=175C, Vds=80% Rated 0 30 1000 Hrs
Gate Bias Tc=175C, Vgs=100% Rated 0 30 1000 Hrs
Temp Cycle -65C, +150C, Air 0 30 1000 Cyc
Thermal Shock -65C, +150C, Liquid 0 30 1000 Cyc
Pressure Cooker Ta=121C, 15psi 0 30 96 Hrs
Relative Humidity Ta=85C, RH=85% 0 30 1000 Hrs

 

Part Number Type Die Type Package
HGTP14N40F3VL 49023 TO-220
Test 3140 Lot 2
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=4.75W, delta Tj=125C 0 30 10,000 Cyc
Drain Bias Tc=175C, Vds=80% Rated 0 30 1000 Hrs
Gate Bias Tc=175C, Vgs=100% Rated 0 30 1000 Hrs
Temp Cycle -65C, +150C, Air 0 30 1000 Cyc
Thermal Shock -65C, +150C, Liquid 0 30 1000 Cyc
Pressure Cooker Ta=121C, 15psi 0 30 96 Hrs
Relative Humidity Ta=85C, RH=85% 0 30 1000 Hrs

 

Part Number Type Die Type Package
HGTP14N40F3VL 49023 TO-220
Test 3140 Lot 3
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=4.75W, delta Tj=125C 0 30 10,000 Cyc
Drain Bias Tc=175C, Vds=80% Rated 0 30 1000 Hrs
Gate Bias Tc=175C, Vgs=100% Rated 0 30 1000 Hrs
Temp Cycle -65C, +150C, Air 0 30 1000 Cyc
Thermal Shock -65C, +150C, Liquid 0 30 1000 Cyc
Pressure Cooker Ta=121C, 15psi 0 30 96 Hrs
Relative Humidity Ta=85C, RH=85% 0 30 1000 Hrs

 

Part Number Type Die Type Package
HGTP14N40F3VL 49023 TO-220
Test 2087 Lot 1
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=4.75W, delta Tj=125C 0 20 10,000 Cyc
Drain Bias Tc=150C, Vds=80% Rated 0 20 1000 Hrs
Gate Bias Tc=150C, Vgs=100% Rated 0 20 1000 Hrs
Thermal Shock -65C, +150C, Liquid 0 10 1000 Cyc
Pressure Cooker Ta=121C, 15psi 0 20 96 Hrs
Relative Humidity Ta=85C, RH=85% 0 20 1000 Hrs

 

Part Number Type Die Type Package
HGTP14N40F3VL 49023 TO-220
Test 2102 Lot 2
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=4.75W, delta Tj=125C 0 20 10,000 Cyc
Drain Bias Tc=150C, Vds=80% Rated 0 20 1000 Hrs
Gate Bias Tc=150C, Vgs=100% Rated 0 40 1000 Hrs
Pressure Cooker Ta=121C, 15psi 0 20 96 Hrs
Relative Humidity Ta=85C, RH=85% 0 20 1000 Hrs

 

Part Number Type Die Type Package
HGTX14N40F3VL 49023 TO-263
Test 5125
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=4.75W, delta Tj=125C 0 30 10,000 Cyc
Drain Bias Tc=150C, Vds=80% Rated 0 30 1000 Hrs
Gate Bias Tc=150C, Vgs=100% Rated 0 30 1000 Hrs
Temp Cycle -65C, +150C, Air 0 30 1000 Cyc
Thermal Shock -65C, +150C, Liquid 0 30 1000 Cyc
Pressure Cooker Ta=121C, 15psi 0 30 168 Hrs
Relative Humidity Ta=85C, RH=85%, 200V 0 30 1000 Hrs

 

Part Number Type Die Type Package
HGTX14N40F3VL 49023 TO-263
Test 5125
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=4.75W, delta Tj=125C 0 30 10,000 Cyc
Drain Bias Tc=150C, Vds=80% Rated 0 30 1000 Hrs
Gate Bias Tc=150C, Vgs=100% Rated 0 30 1000 Hrs
Temp Cycle -65C, +150C, Air 0 30 1000 Cyc
Thermal Shock -65C, +150C, Liquid 0 30 1000 Cyc
Pressure Cooker Ta=121C, 15psi 0 30 168 Hrs
Relative Humidity Ta=85C, RH=85%, 200V 0 30 1000 Hrs
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