49026 NCH PWR MOS CURRENT LIMIT LOGIC GATE Reliability Qualification Report - Fairchild Discrete Power

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Power MOSFET Reliability Summary

Part Number Type		Die Type		Package
RLP03N07CLE		49026		TO-252
Test 2166
Stress	Conditions	Results	Sample Size	Duration
Thermal Fatigue	PD=2W, delta Tj=100C	0	80	20,000	Cyc
Drain Bias	Tc=150C, Vds=80% Rated	0	80	1000	Hrs
Gate Bias	Tc=150C, Vgs=100% Rated	0	80	1000	Hrs
Temp Cycle - Air	-65C, +150C	0	80	1000	Cyc
Pressure Cooker	Ta=121C, 15psi	0	40	96	Hrs
Relative Humidity	Ta=85C, RH=85%	0	40	1000	Hrs

Part Number Type		Die Type		Package
RLP03N07CLE		49026		TO-252
Test
Stress	Conditions	Results	Sample Size	Duration
Thermal Fatigue	PD=2W, delta Tj=100C	0	160	20,000	Cyc
Drain Bias	Tc=150C, Vds=160% Rated	0	160	1000	Hrs
Gate Bias	Tc=150C, Vgs=100% Rated	0	160	1000	Hrs
Temp Cycle - Air	-65C, +150C	0	160	1000	Cyc
Thermal Shock	-65C, +150C, Liquid	0	160	1000	Cyc
Operating LIfe	Tc=175C, Vds=15V	0	160	1000	Hrs
Pressure Cooker	Ta=121C, 15psi	0	160	168	Hrs
Relative Humidity	Ta=85C, RH=85%	0	160	1000	Hrs