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Power MOSFET Reliability Summary
| Part Number Type | Die Type | Package | |||
|---|---|---|---|---|---|
| RFX8P06E | 49044 | SOT-223 | |||
| Test 7094 Lot 1 | |||||
| Stress | Conditions per AEC Q101 |
Results | Sample Size |
Duration | |
| Thermal Fatigue (1) | PD=1W, delta Tj=100C | 0 | 77 | 15,000 | Cyc |
| Drain Bias | Tc=175C, Vds=80% Rated | 0 | 77 | 1000 | Hrs |
| Gate Bias | Tc=175C, Vgs=100% Rated | 1 | 77 | 1000 | Hrs |
| Temp Cycle(1) | -55C, +150C, Air | 0 | 77 | 1000 | Cyc |
| Pressure Cooker(1) | Ta=121C, 15psi | 0 | 77 | 96 | Hrs |
| Relative Humidity(1) | Ta=85C, RH=85%, Vds=45V | 0 | 77 | 1000 | Hrs |
| ESD | CDF-AEC-Q101-001 | 0 | 10 | 2000V HBM | |
| Note 1: Preconditioning per AEC J113 | |||||
| Part Number Type | Die Type | Package | |||
|---|---|---|---|---|---|
| RFX8P06E | 49044 | SOT-223 | |||
| Test 7108 Lot 2 | |||||
| Stress | Conditions per AEC Q101 |
Results | Sample Size |
Duration | |
| Thermal Fatigue (1) | PD=1W, delta Tj=100C | 0 | 77 | 15,000 | Cyc |
| Drain Bias | Tc=175C, Vds=80% Rated | 0 | 77 | 1000 | Hrs |
| Gate Bias | Tc=175C, Vgs=100% Rated | 1 | 77 | 1000 | Hrs |
| Temp Cycle(1) | -55C, +150C, Air | 0 | 77 | 1000 | Cyc |
| Pressure Cooker(1) | Ta=121C, 15psi | 0 | 77 | 96 | Hrs |
| Relative Humidity(1) | Ta=85C, RH=85%, Vds=45V | 0 | 77 | 1000 | Hrs |
| Note 1: Preconditioning per AEC J113 | |||||
| Part Number Type | Die Type | Package | |||
|---|---|---|---|---|---|
| RFD8P06E | 49044 | TO-251/2 | |||
| Lot 1 | |||||
| Stress | Conditions per AEC Q101 |
Results | Sample Size |
Duration | |
| Thermal Fatigue | PD=2W, delta Tj=100C | 0 | 77 | 8,700 | Cyc |
| Drain Bias | Tc=175C, Vds=80% Rated | 0 | 77 | 1000 | Hrs |
| Gate Bias | Tc=175C, Vgs=100% Rated | 0 | 77 | 1000 | Hrs |
| Temp Cycle | -65C, +150C, Air | 0 | 77 | 1000 | Cyc |
| Thermal Shock | -65C, +150C, Liquid | 0 | 77 | 1000 | Cyc |
| Operating LIfe | Tc=175C, Vds=15V | 0 | 77 | 1000 | Hrs |
| Pressure Cooker | Ta=121C, 15psi | 0 | 52 | 96 | Hrs |
| Relative Humidity | Ta=85C, RH=85% | 0 | 77 | 1000 | Hrs |
| Part Number Type | Die Type | Package | |||
|---|---|---|---|---|---|
| RFD8P06E | 49044 | TO-251/2 | |||
| Lot 2 | |||||
| Stress | Conditions per AEC Q101 |
Results | Sample Size |
Duration | |
| Thermal Fatigue | PD=2W, delta Tj=100C | 0 | 77 | 8,700 | Cyc |
| Drain Bias | Tc=175C, Vds=80% Rated | 0 | 77 | 1000 | Hrs |
| Gate Bias | Tc=175C, Vgs=100% Rated | 0 | 77 | 1000 | Hrs |
| Temp Cycle | -65C, +150C, Air | 0 | 77 | 1000 | Cyc |
| Thermal Shock | -65C, +150C, Liquid | 0 | 77 | 1000 | Cyc |
| Operating LIfe | Tc=175C, Vds=15V | 0 | 77 | 1000 | Hrs |
| Pressure Cooker | Ta=121C, 15psi | 0 | 52 | 96 | Hrs |
| Relative Humidity | Ta=85C, RH=85% | 0 | 77 | 1000 | Hrs |
| Part Number Type | Die Type | Package | |||
|---|---|---|---|---|---|
| RFD8P06E | 49044 | TO-251/2 | |||
| Lot 3 | |||||
| Stress | Conditions per AEC Q101 |
Results | Sample Size |
Duration | |
| Thermal Fatigue | PD=2W, delta Tj=100C | 0 | 77 | 8,700 | Cyc |
| Drain Bias | Tc=175C, Vds=80% Rated | 0 | 77 | 1000 | Hrs |
| Gate Bias | Tc=175C, Vgs=100% Rated | 0 | 77 | 1000 | Hrs |
| Temp Cycle | -65C, +150C, Air | 0 | 77 | 1000 | Cyc |
| Thermal Shock | -65C, +150C, Liquid | 0 | 77 | 1000 | Cyc |
| Operating LIfe | Tc=175C, Vds=15V | 0 | 77 | 1000 | Hrs |
| Pressure Cooker | Ta=121C, 15psi | 0 | 52 | 96 | Hrs |
| Relative Humidity | Ta=85C, RH=85% | 0 | 77 | 1000 | Hrs |

