Power MOSFET Reliability Summary

Part Number Type Die Type Package
RFX8P06E 49044 SOT-223
Test 7094 Lot 1
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
Thermal Fatigue (1) PD=1W, delta Tj=100C 0 77 15,000 Cyc
Drain Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
Gate Bias Tc=175C, Vgs=100% Rated 1 77 1000 Hrs
Temp Cycle(1) -55C, +150C, Air 0 77 1000 Cyc
Pressure Cooker(1) Ta=121C, 15psi 0 77 96 Hrs
Relative Humidity(1) Ta=85C, RH=85%, Vds=45V 0 77 1000 Hrs
ESD CDF-AEC-Q101-001 0 10 2000V HBM  
Note 1: Preconditioning per AEC J113

 

Part Number Type Die Type Package
RFX8P06E 49044 SOT-223
Test 7108 Lot 2
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
Thermal Fatigue (1) PD=1W, delta Tj=100C 0 77 15,000 Cyc
Drain Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
Gate Bias Tc=175C, Vgs=100% Rated 1 77 1000 Hrs
Temp Cycle(1) -55C, +150C, Air 0 77 1000 Cyc
Pressure Cooker(1) Ta=121C, 15psi 0 77 96 Hrs
Relative Humidity(1) Ta=85C, RH=85%, Vds=45V 0 77 1000 Hrs
Note 1: Preconditioning per AEC J113

 

Part Number Type Die Type Package
RFD8P06E 49044 TO-251/2
Lot 1
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
Thermal Fatigue PD=2W, delta Tj=100C 0 77 8,700 Cyc
Drain Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
Gate Bias Tc=175C, Vgs=100% Rated 0 77 1000 Hrs
Temp Cycle -65C, +150C, Air 0 77 1000 Cyc
Thermal Shock -65C, +150C, Liquid 0 77 1000 Cyc
Operating LIfe Tc=175C, Vds=15V 0 77 1000 Hrs
Pressure Cooker Ta=121C, 15psi 0 52 96 Hrs
Relative Humidity Ta=85C, RH=85% 0 77 1000 Hrs

 

Part Number Type Die Type Package
RFD8P06E 49044 TO-251/2
Lot 2
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
Thermal Fatigue PD=2W, delta Tj=100C 0 77 8,700 Cyc
Drain Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
Gate Bias Tc=175C, Vgs=100% Rated 0 77 1000 Hrs
Temp Cycle -65C, +150C, Air 0 77 1000 Cyc
Thermal Shock -65C, +150C, Liquid 0 77 1000 Cyc
Operating LIfe Tc=175C, Vds=15V 0 77 1000 Hrs
Pressure Cooker Ta=121C, 15psi 0 52 96 Hrs
Relative Humidity Ta=85C, RH=85% 0 77 1000 Hrs

 

Power MOSFET Reliability Summary
Part Number Type Die Type Package
RFD8P06E 49044 TO-251/2
Lot 3
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
Thermal Fatigue PD=2W, delta Tj=100C 0 77 8,700 Cyc
Drain Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
Gate Bias Tc=175C, Vgs=100% Rated 0 77 1000 Hrs
Temp Cycle -65C, +150C, Air 0 77 1000 Cyc
Thermal Shock -65C, +150C, Liquid 0 77 1000 Cyc
Operating LIfe Tc=175C, Vds=15V 0 77 1000 Hrs
Pressure Cooker Ta=121C, 15psi 0 52 96 Hrs
Relative Humidity Ta=85C, RH=85% 0 77 1000 Hrs
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