49076 NCH PWR IGBT LOGIC GATE Reliability Qualification Report - Fairchild Discrete Power

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Power Reliability Summary

Part Number Type		Die Type		Package
HGTP20N35G3VL		49076		TO-220
Test 8140 Lot 1
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Power Cycling	PD=4.0W, delta Tj=100C	0	77	8750	Cyc
CE Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Relative Humidity	Ta=85C, RH=85%, V=100V	0	77	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	77	1000	Cyc
Pressure Cooker	Ta=121C, 15psi	0	77	96	Hrs
DPA	CDF-AEC-Q101-004 S4	0	4

Part Number Type		Die Type		Package
HGTP20N35G3VL		49076		TO-220
Test 8140 Lot 2
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Power Cycling	PD=4.0W, delta Tj=100C	0	77	8750	Cyc
CE Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Relative Humidity	Ta=85C, RH=85%, V=100V	0	77	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	77	1000	Cyc
Pressure Cooker	Ta=121C, 15psi	0	77	96	Hrs
DPA	CDF-AEC-Q101-004 S4	0	4

Part Number Type		Die Type		Package
HGTP20N35G3VL		49076		TO-220
Test 6033 Lot 1
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Gate Bias	Tc=175C, Vgs=100% Rated	0	100	1000	Hrs
Relative Humidity	Ta=85C, RH=85%, V=100V	0	100	1000	Hrs
ESD	4kV GE/GC, 10,000 CE	0	30
Abnormal Op Life	L=6 Mh, 0.5ohms, Ipk=7A	0	40
Negative Transient	Vce=-150V, 125C	0	40	1000	cyc
Reverse Battery	Vce=-20V, 125C	0	40	1	Min
SOA Useage	Per N6540010FDMAS	0	40	0.5	Sec
SOA Step Stress	IC=7A + 1A steps	0	120		Until Failure

Part Number Type		Die Type		Package
HGTP20N35G3VL		49076		TO-220
Test 6033 Lot 2
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Gate Bias	Tc=175C, Vgs=100% Rated	0	100	1000	Hrs
Relative Humidity	Ta=85C, RH=85%, V=100V	0	100	1000	Hrs
ESD	4kV GE/GC, 10,000 CE	0	30
Abnormal Op Life	L=6 Mh, 0.5ohms, Ipk=7A	0	40
Negative Transient	Vce=-150V, 125C	0	40	1000	cyc
Reverse Battery	Vce=-20V, 125C	0	40	1	Min
SOA Useage	Per N6540010FDMAS	0	40	0.5	Sec
SOA Step Stress	IC=7A + 1A steps	0	120		Until Failure

Part Number Type		Die Type		Package
HGTP20N35G3VL		49076		TO-220
Test 6033 Lot 3
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Gate Bias	Tc=175C, Vgs=100% Rated	0	100	1000	Hrs
Relative Humidity	Ta=85C, RH=85%, V=100V	0	100	1000	Hrs
ESD	4kV GE/GC, 10,000 CE	0	30
Abnormal Op Life	L=6 Mh, 0.5ohms, Ipk=7A	0	40
Negative Transient	Vce=-150V, 125C	0	40	1000	cyc
Reverse Battery	Vce=-20V, 125C	0	40	1	Min
SOA Useage	Per N6540010FDMAS	0	40	0.5	Sec
SOA Step Stress	IC=7A + 1A steps	0	120		Until Failure

Part Number Type		Die Type		Package
HGTP20N35F3VL		49076		TO-220
Test 3115 Lot 1
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue	PD=4.75W, delta Tj=125C	0	77	10,000	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle	-65C, +150C, Air	0	77	1000	Cyc
Thermal Shock	-65C, +150C, Liquid	0	77	1000	Cyc
Pressure Cooker	Ta=121C, 15psi	0	52	96	Hrs
Relative Humidity	Ta=85C, RH=85%	0	77	1000	Hrs

**Power IGBT Reliability Summary**
Part Number Type		Die Type		Package
HGTP20N35F3VL		49076		TO-220
Test 3120 Lot 2
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue	PD=4.75W, delta Tj=125C	0	77	10,000	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle	-65C, +150C, Air	0	77	1000	Cyc
Thermal Shock	-65C, +150C, Liquid	0	77	1000	Cyc
Pressure Cooker	Ta=121C, 15psi	0	52	96	Hrs
Relative Humidity	Ta=85C, RH=85%	0	77	1000	Hrs

Part Number Type		Die Type		Package
HGTP20N35F3VL		49076		TO-220
Test 3120 Lot 3
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue	PD=4.75W, delta Tj=125C	0	77	10,000	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle	-65C, +150C, Air	0	77	1000	Cyc
Thermal Shock	-65C, +150C, Liquid	0	77	1000	Cyc
Pressure Cooker	Ta=121C, 15psi	0	52	96	Hrs
Relative Humidity	Ta=85C, RH=85%	0	77	1000	Hrs

Part Number Type		Die Type		Package
HGTP20N35F3VL		49076		TO-220
Test 3144 Lot 4
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue	PD=4.75W, delta Tj=125C	0	77	10,000	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle	-65C, +150C, Air	0	77	1000	Cyc
Thermal Shock	-65C, +150C, Liquid	0	77	1000	Cyc
Pressure Cooker	Ta=121C, 15psi	0	52	96	Hrs
Relative Humidity	Ta=85C, RH=85%	0	77	1000	Hrs