Fab 8 Power Reliability Summary

Test 8033 Lot 1
Part Number Type Die Type Package
HGT1S20N35G3VL 49076 TO-263
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
Power Cycling PD=4.0W, delta Tj=100C 0 40 10,000 Cyc
Inductive Op Life(1) Ipk=7A, 1mH, 1.5 ohms, Tj=150C 0 10 10,000 Hrs
CE Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
Gate Bias Tc=175C, Vgs=100% Rated 0 77 1000 Hrs
Relative Humidity(1) Ta=85C, RH=85%, V=100V 0 77 1000 Hrs
ESD 4kV GE/GC, 10,000 CE 0 30    
Abnormal Op Life(1) L=6 Mh, 0.5ohms, Ipk=7A 0 20    
Negative Transient(1) Vce=-150V, 125C 0 40 1000 cyc
Reverse Battery(1) Vce=-20V, 125C 0 40 1 Min
SOA Useage(1) Per N6540010FDMAS 0 40 0.5 Sec
SOA Step Stress(1) IC=7A + 1A steps 0 40   Until Failure
DPA CDF-AEC-Q101-004 S4 0 4    
Solderability Mil Std 750, M2060 0 40    
Solder Heat JEDEC 24-3,4,6 0 40    
Die Attach Voids Xray 10% Total, 5% Single 0 40    
Physical Dimensions Per Spec 0 30    

Note 1: Preconditioned with 3 passes of Vapor Phase per AEC Q101



Test 8033 Lot 2
Part Number Type Die Type Package
HGT1S20N35G3VL 49076 TO-263
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
Power Cycling PD=4.0W, delta Tj=100C 0 40 10,000 Cyc
Inductive Op Life(1) Ipk=7A, 1mH, 1.5 ohms, Tj=150C 0 10 10,000 Hrs
CE Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
Gate Bias Tc=175C, Vgs=100% Rated 0 77 1000 Hrs
Relative Humidity(1) Ta=85C, RH=85%, V=100V 0 77 1000 Hrs
ESD 4kV GE/GC, 10,000 CE 0 30    
Abnormal Op Life(1) L=6 Mh, 0.5ohms, Ipk=7A 0 20    
Negative Transient(1) Vce=-150V, 125C 0 40 1000 cyc
Reverse Battery(1) Vce=-20V, 125C 0 40 1 Min
SOA Useage(1) Per N6540010FDMAS 0 40 0.5 Sec
SOA Step Stress(1) IC=7A + 1A steps 0 40   Until Failure
DPA CDF-AEC-Q101-004 S4 0 4    
Solderability Mil Std 750, M2060 0 40    
Solder Heat JEDEC 24-3,4,6 0 40    
Die Attach Voids Xray 10% Total, 5% Single 0 40    

Note 1: Preconditioned with 3 passes of Vapor Phase per AEC Q101



Test 8033 Lot 3
Part Number Type Die Type Package
HGT1S20N35G3VL 49076 TO-263
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
Power Cycling PD=4.0W, delta Tj=100C 0 40 10,000 Cyc
Inductive Op Life(1) Ipk=7A, 1mH, 1.5 ohms, Tj=150C 0 10 10,000 Hrs
CE Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
Gate Bias Tc=175C, Vgs=100% Rated 0 77 1000 Hrs
Relative Humidity(1) Ta=85C, RH=85%, V=100V 0 77 1000 Hrs
ESD 4kV GE/GC, 10,000 CE 0 30    
Abnormal Op Life(1) L=6 Mh, 0.5ohms, Ipk=7A 0 20    
Negative Transient(1) Vce=-150V, 125C 0 40 1000 cyc
Reverse Battery(1) Vce=-20V, 125C 0 40 1 Min
SOA Useage(1) Per N6540010FDMAS 0 40 0.5 Sec
SOA Step Stress(1) IC=7A + 1A steps 0 40   Until Failure
DPA CDF-AEC-Q101-004 S4 0 4    
Solderability Mil Std 750, M2060 0 40    
Solder Heat JEDEC 24-3,4,6 0 40    
Die Attach Voids Xray 10% Total, 5% Single 0 40    

Note 1: Preconditioned with 3 passes of Vapor Phase per AEC Q101

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