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Power IGBT Reliability Summary
| Part Number Type | Die Type | Package | |||
|---|---|---|---|---|---|
| HGTD7N60C3 | 49115 | TO-251/2 | |||
| Test=K | |||||
| Stress | Conditions | Results | Sample Size |
Duration | |
| Thermal Fatigue | PD=2W, delta Tj=100C | 0 | 40 | 20,000 | Cyc |
| Drain Bias | Tc=150C, Vds=80% Rated | 0 | 40 | 500 | Hrs |
| Gate Bias | Tc=150C, Vgs=100% Rated | 0 | 20 | 500 | Hrs |
| Op LIfe | Tc=150C, Vgs=15V | 0 | 20 | 500 | Hrs |
| Thermal Shock | -65C, +150C, Air | 0 | 20 | 600 | Cyc |
| Pressure Cooker | Ta=121C, 15psi | 0 | 20 | 96 | Hrs |
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