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Power IGBT Reliability Summary
| Part Number Type | Die Type | Package | |||
|---|---|---|---|---|---|
| HGTP15N120C3 | 49145 | TO-220 | |||
| Tests 5086 & 6110 | |||||
| Stress | Conditions | Results | Sample Size |
Duration | |
| Thermal Fatigue | PD=4.75W, delta Tj=125C | 0 | 20 | 10,000 | Cyc |
| Drain Bias | Tc=150C, Vds=80% Rated | 1 | 60 | 1000 | Hrs |
| Gate Bias | Tc=150C, Vgs=100% Rated | 0 | 60 | 1000 | Hrs |
| Temp Cycle | -65C, +150C, Air | 0 | 20 | 1000 | Cyc |
| Operating LIfe | Tc=175C, Vds=15V | 0 | 40 | 1000 | Hrs |
| Pressure Cooker | Ta=121C, 15psi | 0 | 20 | 96 | Hrs |
| Relative Humidity | Ta=85C, RH=85% | 0 | 40 | 1000 | Hrs |
| Part Number Type | Die Type | Package | |||
|---|---|---|---|---|---|
| HGTP15N120C3D | 49133(49145 IGBT + 49098 Diode) | TO-247 | |||
| Tests 5096 & 6097 | |||||
| Stress | Conditions | Results | Sample Size |
Duration | |
| Thermal Fatigue | PD=40W, delta Tj=110C | 0 | 10 | 10,000 | Cyc |
| Drain Bias | Tc=150C, Vds=80% Rated | 0 | 80 | 1000 | Hrs |
| Gate Bias | Tc=150C, Vgs=100% Rated | 0 | 80 | 1000 | Hrs |
| Temp Cycle | -65C, +150C, Air | 0 | 40 | 1000 | Cyc |
| Operating LIfe | Tc=175C, Vds=15V | 0 | 80 | 1000 | Hrs |
| Pressure Cooker | Ta=121C, 15psi | 0 | 20 | 96 | Hrs |
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