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Fab 8 Power MOSFET Reliability Summary
| Part Number Type | Die Type | Package | |||
|---|---|---|---|---|---|
| RF1S40N10LE | 49163 | TO-263 | |||
| Test 7105 | |||||
| Stress | Conditions per AEC Q101 |
Results | Sample Size |
Duration | |
| Thermal Fatigue(1) | PD=4.75W, delta Tj=100C | 0 | 40 | 10,000 | Cyc |
| Drain Bias | Tc=175C, Vds=80% Rated | 0 | 77 | 1000 | Hrs |
| Gate Bias | Tc=175C, Vgs=100% Rated | 0 | 77 | 1000 | Hrs |
| Temp Cycle(1) | -55C, +150C, Air | 0 | 77 | 1000 | Cyc |
| Pressure Cooker(1) | Ta=121C, 15psi | 0 | 77 | 96 | Hrs |
| Relative Humidity(1) | Ta=85C, RH=85%, Vds=80V | 0 | 77 | 1000 | Hrs |
| ESD | CDF-AEC-Q101-001 | 0 | 10 | 8000V HBM/400V MM | |
| Dielectric Integrity | CDF-AEC-Q101-004 S3 | 0 | 5 | ||
| UIS | CDF-AEC-Q101-004 S2 | 0 | 5T + 5C | ||
| DPA | CDF-AEC-Q101-004 S4 | 0 | 2 | ||
| Thermal Resistance | JEDEC 106A | 0 | 30 | ||
| Solder Heat | JEDEC 24-3,4,6 | 0 | 10T + 10C | ||
| Die Shear | Mil Std 750 M2037 | 0 | 5T + 5C | ||
| Note 1: Preconditioning per AEC J113 | |||||
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