49230 NCH PWR MOS Reliability Qualification Report - Fairchild Discrete Power

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Package Qual Reliability Summary

Part Number Type		Die Type		Package
IRFP9150		49230		TO-247
Test 9028 CELL 1
Stress	Conditions	Results	Sample Size	Duration
IOL	PD=6.750W, delta Tj=100C	0	40	10000	Cyc
HT Drain Bias	Tc=150C, Vds=80% Rated	0	40	1000	Hrs
HT Gate Bias	Tc=150C, Vgs=100% Rated	0	40	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	40	1000	Cyc
Autoclave	Ta=121C, 15psi	0	40	96	Hrs
H³TRB	Ta=85C, RH=85%, Vds=45V	0	40	1000	Hrs
Operating Life	Tj=150C, VDS=15V	0	40	1000	Hrs

Part Number Type		Die Type		Package
IRFP9150		49230		TO-247
Test 9028 CELL 2
Stress	Conditions	Results	Sample Size	Duration
IOL	PD=6.750W, delta Tj=100C	0	40	10000	Cyc
HT Drain Bias	Tc=150C, Vds=80% Rated	0	40	1000	Hrs
HT Gate Bias	Tc=150C, Vgs=100% Rated	0	40	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	40	1000	Cyc
Autoclave	Ta=121C, 15psi	0	40	96	Hrs
H³TRB	Ta=85C, RH=85%, Vds=45V	0	40	1000	Hrs
Operating Life	Tj=150C, VDS=15V	0	40	1000	Hrs