NPT IGBT Reliability Summary

Part Number Type Die Type Package
HGTG30N120CN 49280 TO-247
Test 7146 Lot 1
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=40W, delta Tj=100C 0 40 10,000 Cyc
CE Bias Tc=150C, Vce=80% Rated 0 40 1000 Hrs
Gate Bias Tc=150C, Vge=100% Rated 0 40 1000 Hrs
Temp Cycle -55C, +150C, Air 0 40 1000 Cyc
Operating LIfe Tc=150C, Vds=15V 0 20 1000 Hrs
Pressure Cooker Ta=121C, 15psi 0 40 96 Hrs
Relative Humidity Ta=85C, RH=85% 0 40 1000 Hrs

 

Part Number Type Die Type Package
HGTG30N120CN 49280 TO-247
Test 7146 Lot 2
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=40W, delta Tj=100C 0 40 10,000 Cyc
CE Bias Tc=150C, Vce=80% Rated 0 40 1000 Hrs
Gate Bias Tc=150C, Vge=100% Rated 0 40 1000 Hrs
Temp Cycle -55C, +150C, Air 0 40 1000 Cyc
Operating LIfe Tc=150C, Vds=15V 0 20 1000 Hrs
Pressure Cooker Ta=121C, 15psi 0 40 96 Hrs
Relative Humidity Ta=85C, RH=85% 0 40 1000 Hrs

 

Part Number Type Die Type Package
HGTG30N120CN 49280 TO-247
Test 7146 Lot 3
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=40W, delta Tj=100C 0 40 10,000 Cyc
CE Bias Tc=150C, Vce=80% Rated 0 40 1000 Hrs
Gate Bias Tc=150C, Vge=100% Rated 0 40 1000 Hrs
Temp Cycle -55C, +150C, Air 0 40 1000 Cyc
Operating LIfe Tc=150C, Vds=15V 0 20 1000 Hrs
Pressure Cooker Ta=121C, 15psi 0 40 96 Hrs
Relative Humidity Ta=85C, RH=85% 0 40 1000 Hrs
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