NPT IGBT Reliability Summary

Part Number Type Die Type Package
HGTP11N120CN 49291 TO-220
Test 8035 Lot 1
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=4.75W, delta Tj=100C 0 40 10,000 Cyc
CE Bias Tc=150C, Vce=80% Rated 0 40 1000 Hrs
Gate Bias Tc=150C, Vge=100% Rated 0 40 1000 Hrs
Temp Cycle -55C, +150C, Air 0 40 1000 Cyc
Operating LIfe Tc=150C, Vds=15V 0 20 1000 Hrs
Pressure Cooker Ta=121C, 15psi 0 40 96 Hrs
Relative Humidity Ta=85C, RH=85% 0 40 1000 Hrs

 

Part Number Type Die Type Package
HGTP11N120CN 49291 TO-220
Test 8035 Lot 2
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=4.75W, delta Tj=100C 0 40 10,000 Cyc
CE Bias Tc=150C, Vce=80% Rated 0 40 1000 Hrs
Gate Bias Tc=150C, Vge=100% Rated 0 40 1000 Hrs
Temp Cycle -55C, +150C, Air 0 40 1000 Cyc
Operating LIfe Tc=150C, Vds=15V 0 20 1000 Hrs
Pressure Cooker Ta=121C, 15psi 0 40 96 Hrs
Relative Humidity Ta=85C, RH=85% 0 40 1000 Hrs

 

Part Number Type Die Type Package
HGTP11N120CN 49291 TO-220
Test 8035 Lot 3
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=4.75W, delta Tj=100C 0 40 10,000 Cyc
CE Bias Tc=150C, Vce=80% Rated 0 40 1000 Hrs
Gate Bias Tc=150C, Vge=100% Rated 0 40 1000 Hrs
Temp Cycle -55C, +150C, Air 0 40 1000 Cyc
Operating LIfe Tc=150C, Vds=15V 0 20 1000 Hrs
Pressure Cooker Ta=121C, 15psi 0 40 96 Hrs
Relative Humidity Ta=85C, RH=85% 0 40 1000 Hrs
Multilanguage - Chinese Multilanguage - English Multilanguage - Japanese Multilanguage - Korean