49349 NCH IGBT Reliability Qualification Report - Fairchild Discrete Power

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Power IGBT Reliability Summary

Part Number Type		Die Type		Package
HGTN40N60A4D		49349		SOT-227
Test 10096
Stress	Conditions	Results	Sample Size	Duration
Thermal Fatigue	PD=40W, delta Tj=100C	0	30	8750	Cyc
Drain Bias	Tc=150C, Vce=80% Rated	0	30	1000	Hrs
Gate Bias	Tc=150C, Vge=100% Rated	0	15	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	30	1000	Cyc
Pressure Cooker	Ta=121C, 15psi	0	30	96	Hrs
Relative Humidity	Ta=85C, RH=85% Vce=40V	0	15	1000	Hrs

Part Number Type		Die Type		Package
HGTN40N60A4D		49349		SOT-227
Test 11030 Cell 1
Stress	Conditions	Results	Sample Size	Duration
Thermal Fatigue	PD=40W, delta Tj=100C	0	40	8750	Cyc
Drain Bias	Tc=150C, Vce=80% Rated	0	39	1000	Hrs
Gate Bias	Tc=150C, Vge=100% Rated	0	40	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	30	1000	Cyc
Pressure Cooker	Ta=121C, 15psi	0	30	96	Hrs
Relative Humidity	Ta=85C, RH=85% Vce=40V	0	30	1000	Hrs

Part Number Type		Die Type		Package
HGTN40N60A4D		49349		SOT-227
Test 11030 Cell 2
Stress	Conditions	Results	Sample Size	Duration
Thermal Fatigue	PD=40W, delta Tj=100C	0	40	8750	Cyc
Drain Bias	Tc=150C, Vce=80% Rated	0	40	1000	Hrs
Gate Bias	Tc=150C, Vge=100% Rated	0	40	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	30	1000	Cyc
Pressure Cooker	Ta=121C, 15psi	0	30	96	Hrs
Relative Humidity	Ta=85C, RH=85% Vce=40V	0	30	1000	Hrs