49367 NCH IGBT Reliability Qualification Report - Fairchild Discrete Power

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Power IGBT Reliability Summary

Part Number Type		Die Type		Package
IGTG12N60AE		49367		TO-247
Test 10032
Stress	Conditions	Results	Sample Size	Duration
Thermal Fatigue	PD=7.0W, delta Tj=100C	0	40	8750	Cyc
Drain Bias	Tc=150C, Vce=80% Rated	0	40	1000	Hrs
Gate Bias	Tc=150C, Vge=100% Rated	0	40	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	40	1000	Cyc
Operating Life	Tc=150C, Vce=15V	0	40	1000	Hrs
Pressure Cooker	Ta=121C, 15psi	0	40	96	Hrs
Relative Humidity	Ta=85C, RH=85%	0	40	1000	Hrs

Part Number Type		Die Type		Package
HGTG3N60A4		49367		TO-247
Test 9086
Stress	Conditions	Results	Sample Size	Duration
Thermal Fatigue	PD=4.75W, delta Tj=100C	0	40	8750	Cyc
Drain Bias	Tc=150C, Vce=80% Rated	0	39	1000	Hrs
Gate Bias	Tc=150C, Vge=100% Rated	0	80	1000	Hrs
Temp Cycle	-65C, +150C, Air	0	40	1000	Cyc
Operating LIfe	Tc=150C, Vce=15V	0	20	1000	Hrs
Pressure Cooker	Ta=121C, 15psi	0	40	96	Hrs
Relative Humidity	Ta=85C, RH=85%	0	40	1000	Hrs