Power UltraFET® Reliability Summary

Part Number Type Die Type Package
HUF75631SK8 75631 SOP-8
Test 9909 Lot 2
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
IOL(1) PD=1.0W, delta Tj=100C 0 40 15,000 Cyc
HT Drain Bias Tc=150C, Vds=80% Rated 0 40 1000 Hrs
HT Gate Bias Tc=150C, Vgs=100% Rated 0 40 1000 Hrs
Temp Cycle(1) -55C, +150C, Air 0 40 1000 Cyc
Autoclave(1) Ta=121C, 15psi 0 40 96 Hrs
H3TRB(1) Ta=85C, RH=85%, Vds=40V 0 40 1000 Hrs
Operating Life Tj=175C, VDS=15V 0 40 1000 Hrs
Note: See 76407 for Package Qual data

 

Part Number Type Die Type Package
HUF75631SK8 75631 SOP-8
Test 9909 Lot 3
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
IOL(1) PD=1.0W, delta Tj=100C 0 40 15,000 Cyc
HT Drain Bias Tc=150C, Vds=80% Rated 0 40 1000 Hrs
HT Gate Bias Tc=150C, Vgs=100% Rated 1 40 1000 Hrs
Temp Cycle(1) -55C, +150C, Air 0 40 1000 Cyc
Autoclave(1) Ta=121C, 15psi 0 40 96 Hrs
H3TRB(1) Ta=85C, RH=85%, Vds=40V 0 40 1000 Hrs
Operating Life Tj=175C, VDS=15V 0 40 1000 Hrs
Note: See 76407 for Package Qual data
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