75652 Ultrafet NCH PWR MOS STD GATE Reliability Qualification Report - Fairchild Discrete Power

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Power MOSFET Reliability Summary

Part Number Type		Die Type		Package
HUF75652G3		75652		TO-247
Test 9044 Lot 1
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue	PD=7W, delta Tj=100C	0	40	5,000	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	40	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	40	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	40	1000	Cyc
Operating LIfe	Tc=175C, Vds=15V	0	40	1000	Hrs
Pressure Cooker	Ta=121C, 15psi	0	40	96	Hrs
Relative Humidity	Ta=85C, RH=85%	0	40	1000	Hrs

Part Number Type		Die Type		Package
HUF75652G3		75652		TO-247
Test 9044 Lot 2
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue	PD=7W, delta Tj=100C	0	40	5,000	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	40	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	40	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	40	1000	Cyc
Operating LIfe	Tc=175C, Vds=15V	0	40	1000	Hrs
Pressure Cooker	Ta=121C, 15psi	0	40	96	Hrs
Relative Humidity	Ta=85C, RH=85%	0	40	1000	Hrs

Part Number Type		Die Type		Package
HUF75652G3		75652		TO-247
Test 9044 Lot 3
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue	PD=7W, delta Tj=100C	0	40	5,000	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	40	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	40	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	40	1000	Cyc
Operating LIfe	Tc=175C, Vds=15V	0	40	1000	Hrs
Pressure Cooker	Ta=121C, 15psi	0	40	96	Hrs
Relative Humidity	Ta=85C, RH=85%	0	40	1000	Hrs