75852 Ultrafet NCH PWR MOS STD GATE Reliability Qualification Report - Fairchild Discrete Power

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Power UltraFET^® Reliability Summary

Part Number Type		Die Type		Package
HUF75852G3		75852		TO-247
Test 9139 Lot 1
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
IOL	PD=8.5W, delta Tj=100C	0	40	5000	Cyc
HT Drain Bias	Tc=175C, Vds=80% Rated	0	40	1000	Hrs
HT Gate Bias	Tc=175C, Vgs=100% Rated	0	40	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	40	1000	Cyc
Autoclave	Ta=121C, 15psi	0	40	96	Hrs
H³TRB	Ta=85C, RH=85%, Vds=40V	0	40	1000	Hrs
Operating Life	Tj=175C, VDS=15V	0	40	1000	Hrs

Part Number Type		Die Type		Package
HUF75852G3		75852		TO-247
Test 9139 Lot 2
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
IOL	PD=8.5W, delta Tj=100C	0	40	5000	Cyc
HT Drain Bias	Tc=175C, Vds=80% Rated	0	40	1000	Hrs
HT Gate Bias	Tc=175C, Vgs=100% Rated	0	40	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	40	1000	Cyc
Autoclave	Ta=121C, 15psi	0	40	96	Hrs
H³TRB	Ta=85C, RH=85%, Vds=40V	0	40	1000	Hrs
Operating Life	Tj=175C, VDS=15V	0	40	1000	Hrs

Part Number Type		Die Type		Package
HUF75852G3		75852		TO-247
Test 9139 Lot 3
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
IOL	PD=8.5W, delta Tj=100C	0	40	5000	Cyc
HT Drain Bias	Tc=175C, Vds=80% Rated	0	40	1000	Hrs
HT Gate Bias	Tc=175C, Vgs=100% Rated	0	40	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	40	1000	Cyc
Autoclave	Ta=121C, 15psi	0	40	96	Hrs
H³TRB	Ta=85C, RH=85%, Vds=40V	0	40	1000	Hrs
Operating Life	Tj=175C, VDS=15V	0	40	1000	Hrs