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Power UltraFET® Reliability Summary
| Part Number Type | Die Type | Package | |||
|---|---|---|---|---|---|
| HUF75945G3 | 75945 | TO-247 | |||
| Test 10117 Cell 1 | |||||
| Stress | Conditions | Results | Sample Size |
Duration | |
| HT Drain Bias | Tc=150C, Vds=80% Rated | 0 | 80 | 1000 | Hrs |
| HT Gate Bias | Tc=150C, Vgs=100% Rated | 0 | 80 | 1000 | Hrs |
| Operating Life | Tj=150C, VDS=15V | 0 | 40 | 1000 | Hrs |
Note: See 78345 and Ultrafet Qualification for package data |
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