Power UltraFET® Reliability Summary

Part Number Type Die Type Package
HUF76445S3 76445 TO-263
Test 9049 Lot 2
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
IOL(1) PD=4.0W, delta Tj=100C 0 77 8750 Cyc
HT Drain Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
HT Gate Bias Tc=175C, Vgs=100% Rated 0 77 1000 Hrs
Temp Cycle(1) -55C, +150C, Air 0 77 1000 Cyc
Autoclave(1) Ta=121C, 15psi 0 77 96 Hrs
H3TRB(1) Ta=85C, RH=85%, Vds=50V 0 77 1000 Hrs
Operating Life Tj=175C, VDS=15V 0 40 1000 Hrs
ESD CDF-AEC-Q101-001 0 10 1KVHB
400MM
 
DPA CDF-AEC-Q101-004 0 2    
Thermal Resistance JESD-24 0 5    
Dielectric Integrity CDF-AEC-Q101-004 0 5    
UIS CDF-AEC-Q101-004 0 5    
Note 1: Preconditioning per AEC Q101 (J113)

 

Part Number Type Die Type Package
HUF76445S3 76445 TO-263
Test 9049 Lot 4
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
IOL(1) PD=4.0W, delta Tj=100C 0 77 8750 Cyc
HT Drain Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
HT Gate Bias Tc=175C, Vgs=100% Rated 0 77 1000 Hrs
Temp Cycle(1) -55C, +150C, Air 0 77 1000 Cyc
Autoclave(1) Ta=121C, 15psi 0 77 96 Hrs
H3TRB(1) Ta=85C, RH=85%, Vds=50V 0 77 1000 Hrs
Operating Life Tj=175C, VDS=15V 0 40 1000 Hrs
Note 1: Preconditioning per AEC Q101 (J113)

 

Part Number Type Die Type Package
HUF76445S3 76445 TO-263
Test 9049 Lot 6
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
IOL(1) PD=4.0W, delta Tj=100C 0 77 8750 Cyc
HT Drain Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
HT Gate Bias Tc=175C, Vgs=100% Rated 0 77 1000 Hrs
Temp Cycle(1) -55C, +150C, Air 0 77 1000 Cyc
Autoclave(1) Ta=121C, 15psi 0 77 96 Hrs
H3TRB(1) Ta=85C, RH=85%, Vds=50V 0 77 1000 Hrs
Operating Life Tj=175C, VDS=15V 0 40 1000 Hrs
Note 1: Preconditioning per AEC Q101 (J113)

 

Part Number Type Die Type Package
HUF76445S3 76445 TO-263
Test 9049 Lot 1
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
IOL(1) PD=4.0W, delta Tj=100C 0 77 8750 Cyc
HT Drain Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
HT Gate Bias Tc=175C, Vgs=100% Rated 0 77 1000 Hrs
Temp Cycle(1) -55C, +150C, Air 0 77 1000 Cyc
Autoclave(1) Ta=121C, 15psi 0 77 96 Hrs
H3TRB(1) Ta=85C, RH=85%, Vds=50V 0 77 1000 Hrs
Operating Life Tj=175C, VDS=15V 0 40 1000 Hrs
ESD CDF-AEC-Q101-001 0 10 1KVHB
400MM
 
DPA CDF-AEC-Q101-004 0 2    
Thermal Resistance JESD-24 0 5    
Dielectric Integrity CDF-AEC-Q101-004 0 5    
UIS CDF-AEC-Q101-004 0 5    
Note 1: Preconditioning per AEC Q101 (J113)

 

Part Number Type Die Type Package
HUF76445S3 76445 TO-263
Test 9049 Lot 3
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
IOL(1) PD=4.0W, delta Tj=100C 0 77 8750 Cyc
HT Drain Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
HT Gate Bias Tc=175C, Vgs=100% Rated 0 77 1000 Hrs
Temp Cycle(1) -55C, +150C, Air 0 77 1000 Cyc
Autoclave(1) Ta=121C, 15psi 0 77 96 Hrs
H3TRB(1) Ta=85C, RH=85%, Vds=50V 0 77 1000 Hrs
Operating Life Tj=175C, VDS=15V 0 40 1000 Hrs
Note 1: Preconditioning per AEC Q101 (J113)

 

Part Number Type Die Type Package
HUF76445S3 76445 TO-263
Test 9049 Lot 5
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
IOL(1) PD=4.0W, delta Tj=100C 0 77 8750 Cyc
HT Drain Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
HT Gate Bias Tc=175C, Vgs=100% Rated 0 77 1000 Hrs
Temp Cycle(1) -55C, +150C, Air 0 77 1000 Cyc
Autoclave(1) Ta=121C, 15psi 0 77 96 Hrs
H3TRB(1) Ta=85C, RH=85%, Vds=50V 0 77 1000 Hrs
Operating Life Tj=175C, VDS=15V 0 40 1000 Hrs
Note 1: Preconditioning per AEC Q101 (J113)
Multilanguage - Chinese Multilanguage - English Multilanguage - Japanese Multilanguage - Korean