Power UltraFET® Reliability Summary

Part Number Type Die Type Package
HUF76645P3 76645 TO-220A
Test 9071  Lot 1
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
IOL PD=4.0W, delta Tj=100C 0 77 8750 Cyc
HT Drain Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
HT Gate Bias Tc=175C, Vgs=100% Rated 0 77 1000 Hrs
Temp Cycle -55C, +150C, Air 0 77 1000 Cyc
Autoclave Ta=121C, 15psi 0 77 96 Hrs
H3TRB Ta=85C, RH=85%, Vds=80V 0 77 1000 Hrs
Operating Life Tj=175C, VDS=15V 0 40 1000 Hrs
ESD CDF-AEC-Q101-001 0 10 500Kv HB
400V MM
 
DPA CDF-AEC-Q101-004 0 2    
Thermal Resistance JESD-24 0 5    
Dielectric Integrity CDF-AEC-Q101-004 0 5    
UIS CDF-AEC-Q101-004 0 5    

 

Part Number Type Die Type Package
HUF76645 76645 TO-220A
Test 9071  Lot 2
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
IOL PD=4.0W, delta Tj=100C 0 77 8750 Cyc
HT Drain Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
HT Gate Bias Tc=175C, Vgs=100% Rated 0 77 1000 Hrs
Temp Cycle -55C, +150C, Air 0 77 1000 Cyc
Autoclave Ta=121C, 15psi 0 77 96 Hrs
H3TRB Ta=85C, RH=85%, Vds=80V 0 77 1000 Hrs
Operating Life Tj=175C, VDS=15V 0 40 1000 Hrs

 

Part Number Type Die Type Package
HUF76645 76645 TO-220A
Test 9071  Lot 1
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
IOL PD=4.0W, delta Tj=100C 0 77 8750 Cyc
HT Drain Bias Tc=175C, Vds=80% Rated 0 77 1000 Hrs
HT Gate Bias Tc=175C, Vgs=100% Rated 0 77 1000 Hrs
Temp Cycle -55C, +150C, Air 0 77 1000 Cyc
Autoclave Ta=121C, 15psi 0 77 96 Hrs
H3TRB Ta=85C, RH=85%, Vds=80V 0 77 1000 Hrs
Operating Life Tj=175C, VDS=15V 0 40 1000 Hrs
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