Power MOSFET Reliability Summary

Part Number Type		Die Type		Package
HUF75307D3		78307		TO-252
Test 8108 Lot 1
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue(1)	PD=2.0W, delta Tj=100C	0	77	8750	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle(1)	-55C, +150C, Air	0	77	1000	Cyc
Pressure Cooker(1)	Ta=121C, 15psi	0	77	96	Hrs
Relative Humidity(1)	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	77	1000	Hrs
Note 1: Preconditioning per AEC Q101 (J113)

 

Part Number Type		Die Type		Package
HUF75307D3		78307		TO-252
Test 8108 Lot 2
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue(1)	PD=2.0W, delta Tj=100C	0	77	8750	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle(1)	-55C, +150C, Air	0	77	1000	Cyc
Pressure Cooker(1)	Ta=121C, 15psi	0	77	96	Hrs
Relative Humidity(1)	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	77	1000	Hrs
Note 1: Preconditioning per AEC Q101 (J113)

 

Part Number Type		Die Type		Package
HUF75307D3		78307		TO-252
Test 8108 Lot 3
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue(1)	PD=2.0W, delta Tj=100C	0	77	8750	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle(1)	-55C, +150C, Air	0	77	1000	Cyc
Pressure Cooker(1)	Ta=121C, 15psi	0	77	96	Hrs
Relative Humidity(1)	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	77	1000	Hrs
Note 1: Preconditioning per AEC Q101 (J113)

 

Part Number Type		Die Type		Package
HUF75307D3		78307		TO-252
Test 8108 Lot 4
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue(1)	PD=2.0W, delta Tj=100C	0	77	8750	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle(1)	-55C, +150C, Air	0	77	1000	Cyc
Pressure Cooker(1)	Ta=121C, 15psi	0	77	96	Hrs
Relative Humidity(1)	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	77	1000	Hrs
Note 1: Preconditioning per AEC Q101 (J113)

 

Part Number Type		Die Type		Package
HUF75307P3		78307		TO-220
Test 8107 Lot 1
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue	PD=4.75W, delta Tj=100C	0	77	10000	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	77	1000	Cyc
Pressure Cooker	Ta=121C, 15psi	0	77	96	Hrs
Relative Humidity	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	40	1000	Hrs

 

Part Number Type		Die Type		Package
HUF75307P3		78307		TO-220
Test 8107 Lot 3
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue	PD=4.75W, delta Tj=100C	0	77	10000	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	77	1000	Cyc
Pressure Cooker	Ta=121C, 15psi	0	77	96	Hrs
Relative Humidity	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	40	1000	Hrs

 

Part Number Type		Die Type		Package
HUF75307P3		78307		TO-220
Test 8107 Lot 2
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue	PD=4.75W, delta Tj=100C	0	77	10000	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	77	1000	Cyc
Pressure Cooker	Ta=121C, 15psi	0	77	96	Hrs
Relative Humidity	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	40	1000	Hrs

 

Part Number Type		Die Type		Package
HUF75307P3		78307		TO-220
Test 8107 Lot 4
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue	PD=4.75W, delta Tj=100C	0	77	10000	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	77	1000	Cyc
Pressure Cooker	Ta=121C, 15psi	0	77	96	Hrs
Relative Humidity	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	40	1000	Hrs

 

Part Number Type		Die Type		Package
HUF75307P3		75307		TO-220
Test 7066/61AC
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue	PD=4.75W, delta Tj=100C	0	77	10000	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle(1)	-55C, +150C, Air	0	77	1000	Cyc
Pressure Cooker	Ta=121C, 15psi	0	77	96	Hrs
Relative Humidity	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	80	1000	Hrs

 

Part Number Type		Die Type		Package
HUF75307P3		75307		TO-220
Test 7161-1
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue	PD=4.75W, delta Tj=100C	0	77	8750	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	74	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	75	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	77	1000	Cyc
Pressure Cooker	Ta=121C, 15psi	0	77	96	Hrs
Relative Humidity	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	80	1000	Hrs

 

Part Number Type		Die Type		Package
HUF75307P3		75307		TO-220
Test 7161-2
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue(1)	PD=4.75W, delta Tj=100C	0	77	8750	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	73	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	69	1000	Hrs
Temp Cycle(1)	-55C, +150C, Air	0	77	1000	Cyc
Pressure Cooker(1)	Ta=121C, 15psi	0	77	96	Hrs
Relative Humidity(1)	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	80	1000	Hrs

 

Part Number Type		Die Type		Package
HUF75307S3		75307		TO-262
Test 7101
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
Thermal Fatigue	PD=4.75W, delta Tj=100C	0	77	8750	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	77	1000	Cyc
Pressure Cooker	Ta=121C, 15psi	0	77	96	Hrs
Relative Humidity	Ta=85C, RH=85%, Vds=80V	0	76	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	80	1000	Hrs
ESD	CDF-AEC-Q101-001	0	10	250VHB 50MM