78345(L) Ultrafet NCH PWR MOS STD GATE Reliability Qualification Report - Fairchild Discrete Power

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Power UltraFET^® Reliability Summary

Part Number Type		Die Type		Package
HUF75345G3		78345		TO-247
Test 8082 Cell 1
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
IOL	PD=4.75W, delta Tj=100C	0	77	8750	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	77	1000	Cyc
Autoclave	Ta=121C, 15psi	0	77	96	Hrs
H³TRB	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	40	1000	Hrs
ESD	CDF-AEC-Q101-001	0	10	1KVHB 400MM
DPA	CDF-AEC-Q101-004	0	2
Thermal Resistance	JESD-24	0	5
Dielectric Integrity	CDF-AEC-Q101-004	0	5
UIS	CDF-AEC-Q101-004	0	5

Part Number Type		Die Type		Package
HUF75345G3		78345		TO-247
Test 8082 Cell 3
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
IOL	PD=40W, delta Tj=100C	0	77	8750	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	77	1000	Cyc
Autoclave	Ta=121C, 15psi	0	77	96	Hrs
H³TRB	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	40	1000	Hrs

Part Number Type		Die Type		Package
HUF75345G3		78345		TO-247
Test 8082 Cell 5
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
IOL	PD=40W, delta Tj=100C	0	77	8750	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	77	1000	Cyc
Autoclave	Ta=121C, 15psi	0	77	96	Hrs
H³TRB	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	40	1000	Hrs

Part Number Type		Die Type		Package
HUF75345G3		78345		TO-247
Test 8082 Cell 7
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
IOL	PD=4.75W, delta Tj=100C	0	77	8750	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	77	1000	Cyc
Autoclave	Ta=121C, 15psi	0	77	96	Hrs
H³TRB	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	40	1000	Hrs

Part Number Type		Die Type		Package
HUF75345G3		78345		TO-247
Test 8082 Cell 2
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
IOL	PD=40W, delta Tj=100C	0	77	8750	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	77	1000	Cyc
Autoclave	Ta=121C, 15psi	0	77	96	Hrs
H³TRB	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating Life	Tc=175C, Vds=15V	0	40	1000	Hrs

Part Number Type		Die Type		Package
HUF75345G3		78345		TO-247
Test 8082 Cell 4
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
IOL	PD=40W, delta Tj=100C	0	77	8750	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	77	1000	Cyc
Autoclave	Ta=121C, 15psi	0	77	96	Hrs
H³TRB	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	40	1000	Hrs

Part Number Type		Die Type		Package
HUF75345G3		78345		TO-247
Test 8082 Cell 6
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
IOL	PD=4.75W, delta Tj=100C	0	77	8750	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	77	1000	Cyc
Autoclave	Ta=121C, 15psi	0	77	96	Hrs
H³TRB	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	40	1000	Hrs

Part Number Type		Die Type		Package
HUF75345G3		78345		TO-247
Test 8082 Cell 8
Stress	Conditions per AEC Q101	Results	Sample Size	Duration
IOL	PD=4.75W, delta Tj=100C	0	77	8750	Cyc
Drain Bias	Tc=175C, Vds=80% Rated	0	77	1000	Hrs
Gate Bias	Tc=175C, Vgs=100% Rated	0	77	1000	Hrs
Temp Cycle	-55C, +150C, Air	0	77	1000	Cyc
Autoclave	Ta=121C, 15psi	0	77	96	Hrs
H³TRB	Ta=85C, RH=85%, Vds=80V	0	77	1000	Hrs
Operating LIfe	Tc=175C, Vds=15V	0	40	1000	Hrs