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Power MOSFET Reliability Summary
| Part Number Type | Die Type | Package | |||
|---|---|---|---|---|---|
| RFP30P06 | 09834 | TO-220 | |||
| Test 7070 Lot 1 | |||||
| Stress | Conditions per AEC Q101 |
Results | Sample Size |
Duration | |
| Thermal Fatigue | PD=4.75W, delta Tj=125C | 0 | 77 | 8750 | Cyc |
| Drain Bias | Tc=175C, Vds=80% Rated | 0 | 77 | 1000 | Hrs |
| Gate Bias | Tc=175C, Vgs=100% Rated | 0 | 77 | 1000 | Hrs |
| Temp Cycle | -55C, +150C, Air | 0 | 77 | 1000 | Cyc |
| Pressure Cooker | Ta=121C, 15psi | 0 | 77 | 96 | Hrs |
| Relative Humidity | Ta=85C, RH=85%, Vds=80V | 0 | 77 | 1000 | Hrs |
| ESD | CDF-AEC-Q101-001 | 0 | 10 | 1000VHBM | 400V MM |
| Part Number Type | Die Type | Package | |||
|---|---|---|---|---|---|
| RFP30P06 | 09834 | TO-220 | |||
| Test 7070 Lot 2 | |||||
| Stress | Conditions per AEC Q101 |
Results | Sample Size |
Duration | |
| Thermal Fatigue | PD=4.75W, delta Tj=125C | 0 | 77 | 8750 | Cyc |
| Drain Bias | Tc=175C, Vds=80% Rated | 0 | 77 | 1000 | Hrs |
| Gate Bias | Tc=175C, Vgs=100% Rated | 0 | 77 | 1000 | Hrs |
| Temp Cycle | -55C, +150C, Air | 0 | 77 | 1000 | Cyc |
| Pressure Cooker | Ta=121C, 15psi | 0 | 77 | 96 | Hrs |
| Relative Humidity | Ta=85C, RH=85%, Vds=80V | 0 | 77 | 1000 | Hrs |
| Part Number Type | Die Type | Package | |||
|---|---|---|---|---|---|
| RFP30P06 | 09834 | TO-220 | |||
| Test 7070 Lot 3 | |||||
| Stress | Conditions per AEC Q101 |
Results | Sample Size |
Duration | |
| Thermal Fatigue | PD=4.75W, delta Tj=125C | 0 | 77 | 8750 | Cyc |
| Drain Bias | Tc=175C, Vds=80% Rated | 0 | 77 | 1000 | Hrs |
| Gate Bias | Tc=175C, Vgs=100% Rated | 0 | 77 | 1000 | Hrs |
| Temp Cycle | -55C, +150C, Air | 0 | 77 | 1000 | Cyc |
| Pressure Cooker | Ta=121C, 15psi | 0 | 77 | 96 | Hrs |
| Relative Humidity | Ta=85C, RH=85%, Vds=80V | 0 | 77 | 1000 | Hrs |
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