Power MOSFET Reliability Summary

Part Number Type Die Type Package
RFG60N10 09846 TO-247
Test KL
Stress Conditions Results Sample
Size
Duration
Thermal Fatigue PD=40W, delta Tj=100C 0 60 12,000 Cyc
Drain Bias Tc=150C, Vds=80% Rated 0 60 500 Hrs
Gate Bias Tc=150C, Vgs=100% Rated 0 60 500 Hrs
Thermal Shock -65C, +150C, Liquid 0 60 500 Cyc
Operating Life Tc=150C, Vds=15V 0 60 500 Hrs
Pressure Cooker Ta=121C, 15psi 0 60 96 Hrs
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