Power MOSFET Reliability Summary

Part Number Type Die Type Package
RF1S50N06L 09872 TO-262/3
Test Lot 1
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
Thermal Fatigue
VP Preconditioned
PD=4.75W, delta Tj=125C 0 80 10,000 Cyc
Drain Bias Tc=150C, Vds=80% Rated 0 80 1000 Hrs
Gate Bias Tc=150C, Vgs=100% Rated 0 80 1000 Hrs
Temp Cycle
VP Preconditioned
-65C, +150C, Air 0 80 1000 Cyc
Thermal Shock
VP Preconditioned
-65C, +150C, Liquid 0 80 1000 Cyc
Operating LIfe Tc=150C, Vds=15V 0 80 1000 Hrs
Pressure Cooker
VP Preconditioned
Ta=121C, 15psi 0 52 96 Hrs
Relative Humidity
VP Preconditioned
Ta=85C, RH=85% 0 80 1000 Hrs
Solderability Mil Std 202 0 15    
Lead Fatigue Mil Std 3 Bends 0 15    

 

Part Number Type Die Type Package
RF1S50N06L 09872 TO-262/3
Test Lot 1
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
Thermal Fatigue
VP Preconditioned
PD=4.75W, delta Tj=125C 0 80 10,000 Cyc
Temp Cycle
VP Preconditioned
-65C, +150C, Air 0 80 1000 Cyc
Pressure Cooker
VP Preconditioned
Ta=121C, 15psi 0 52 96 Hrs

 

Part Number Type Die Type Package
RF1S50N06L 09872 TO-262/3
Test Lot 2
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
Thermal Fatigue
VP Preconditioned
PD=4.75W, delta Tj=125C 0 80 10,000 Cyc
Temp Cycle
VP Preconditioned
-65C, +150C, Air 0 80 1000 Cyc
Pressure Cooker
VP Preconditioned
Ta=121C, 15psi 0 52 96 Hrs

 

Part Number Type Die Type Package
RF1S50N06L 09872 TO-262/3
Test Lot 3
Stress Conditions
per AEC Q101
Results Sample
Size
Duration
Thermal Fatigue
VP Preconditioned
PD=4.75W, delta Tj=125C 0 80 10,000 Cyc
Temp Cycle
VP Preconditioned
-65C, +150C, Air 0 80 1000 Cyc
Pressure Cooker
VP Preconditioned
Ta=121C, 15psi 0 52 96 Hrs
Multilanguage - Chinese Multilanguage - English Multilanguage - Japanese Multilanguage - Korean