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POWER DEVICE RELIABILITY SUMMARY
| DEVICE POWER MOS | PACKAGE TO-247 | |||
| PROCESS HIGH VOLTAGE NCH PWR MOS STD GATE | ||||
| APPLIED STRESS | FAILURES | SAMPLE | CUM. TIME | |
| THERMAL FATIGUE Pd=40 w, Delta=100 deg c |
0 | 240 | 2880000 | CYS |
| OPERATING LIFE 15 volts, T=200 deg c. |
0 | 120 | 60000 | HRS |
| HIGH TEMP REV BIAS 80% Rated voltage, 150 deg c. |
0 | 120 | 60000 | HRS |
| HIGH TEMP GATE BIAS 100% Rated voltage, 150 deg c. |
0 | 100 | 50000 | HRS |
| STORAGE LIFE T=200 deg c. |
0 | 120 | 60000 | HRS |
| TEMPERATURE CYCLE -65 to 150 deg c. Air/Air. |
0 | 20 | 10000 | CYS |
| THERMAL SHOCK -65 to 250 deg c. Liq/Liq. |
0 | 100 | 60000 | CYS |
| AUTOCLAVE T=121 deg c, 15 psig |
0 | 118 | 11328 | HRS |
| FAILURE RATE @ 55 Deg. C, 60%
Confidence, 1.0 EV Activation: 5.469934 FIT |
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