NCH PWR MOS STD Gate - TO-247 Reliability Report

POWER DEVICE RELIABILITY SUMMARY

DEVICE POWER MOS		PACKAGE TO-247
PROCESS HIGH VOLTAGE NCH PWR MOS STD GATE
APPLIED STRESS	FAILURES	SAMPLE	CUM. TIME
THERMAL FATIGUE Pd=40 w, Delta=100 deg c	0	240	2880000	CYS
OPERATING LIFE 15 volts, T=200 deg c.	0	120	60000	HRS
HIGH TEMP REV BIAS 80% Rated voltage, 150 deg c.	0	120	60000	HRS
HIGH TEMP GATE BIAS 100% Rated voltage, 150 deg c.	0	100	50000	HRS
STORAGE LIFE T=200 deg c.	0	120	60000	HRS
TEMPERATURE CYCLE -65 to 150 deg c. Air/Air.	0	20	10000	CYS
THERMAL SHOCK -65 to 250 deg c. Liq/Liq.	0	100	60000	CYS
AUTOCLAVE T=121 deg c, 15 psig	0	118	11328	HRS
FAILURE RATE @ 55 Deg. C, 60% Confidence, 1.0 EV Activation: 5.469934 FIT