NCH PWR HV MOS STD Gate - TO-39 Reliability Report

POWER DEVICE RELIABILITY SUMMARY

DEVICE POWER MOS		PACKAGE TO-39
PROCESS HIGH VOLTAGE NCH PWR MOS STD GATE
APPLIED STRESS	FAILURES	SAMPLE	CUM. TIME
THERMAL FATIGUE Pd=1 w, Delta=70 deg c.	0	238	2856000	CYS
OPERATING LIFE 15 volts, T=200 deg c.	0	120	60000	HRS
HIGH TEMP REV BIAS 80% Rated voltage, 150 deg c.	0	115	57500	HRS
HIGH TEMP GATE BIAS 100% Rated voltage, 150 deg c.	0	120	60000	HRS
STORAGE LIFE T=200 deg c.	0	120	60000	HRS
TEMPERATURE CYCLE -65 to 150 deg c. Air/Air	0	120	60000	CYS
FAILURE RATE @ 55 Deg. C, 60% Confidence, 1.0 EV Activation: 5.70785 FIT