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POWER DEVICE RELIABILITY SUMMARY
| DEVICE POWER MOS | PACKAGE TO-39 | |||
| PROCESS LOW VOLTAGE NCH PWR MOS LOGIC LEVEL | ||||
| APPLIED STRESS | FAILURES | SAMPLE | CUM. TIME | |
| HIGH TEMP GATE BIAS 100% Rated voltage, 150 deg c. |
0 | 20 | 10000 | HRS |
| STORAGE LIFE T=200 deg c. |
0 | 20 | 10000 | HRS |
| TEMPERATURE CYCLE -65 to 150 deg c. AIR/AIR |
0 | 20 | 10000 | CYS |
| FAILURE RATE: INSUFFICIENT DATA | ||||
