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POWER DEVICE RELIABILITY SUMMARY
| DEVICE POWER MOS | PACKAGE TO-39 | |||
| PROCESS LOW VOLTAGE NCH PWR MOS STD GATE | ||||
| APPLIED STRESS | FAILURES | SAMPLE | CUM. TIME | |
| THERMAL FATIGUE Pd=1 w, Delta=70 deg c. |
0 | 200 | 2400000 | CYS |
| OPERATING LIFE 15 volts, T=200 deg c. |
0 | 100 | 50000 | HRS |
| HIGH TEMP REV BIAS 80% Rated voltage, 150 deg c. |
0 | 94 | 47000 | HRS |
| HIGH TEMP GATE BIAS 100% Rated voltage, 150 deg c. |
0 | 100 | 50000 | HRS |
| STORAGE LIFE T=200 deg c. |
0 | 100 | 50000 | HRS |
| TEMPERATURE CYCLE -65 to 150 deg c. Air/Air |
0 | 80 | 40000 | CYS |
| FAILURE RATE @ 55 Deg. C, 60%
Confidence, 1.0 EV Activation: 6.983069 FIT |
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