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POWER DEVICE RELIABILITY SUMMARY
| DEVICE POWER MOS | PACKAGE TO-39 | |||
| PROCESS LOW VOLTAGE PCH PWR MOS | ||||
| APPLIED STRESS | FAILURES | SAMPLE | CUM. TIME | |
| THERMAL FATIGUE Pd=1 w, Delta=70 deg c. |
0 | 160 | 1920000 | CYS |
| OPERATING LIFE 15 volts, T=200 deg c. |
0 | 60 | 30000 | HRS |
| HIGH TEMP REV BIAS 80% Rated voltage, 150 deg c. |
1 | 79 | 395000 | HRS |
| HIGH TEMP GATE BIAS 100% Rated voltage, 150 deg c. |
0 | 80 | 40000 | HRS |
| STORAGE LIFE T=200 deg c. |
0 | 80 | 40000 | HRS |
| TEMPERATURE CYCLE -65 to 150 deg c. Air/Air |
0 | 80 | 40000 | CYS |
| FAILURE RATE @ 55 Deg. C, 60%
Confidence, 1.0 EV Activation: 18.32352 FIT |
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